Evaluation of polarization of embedded piezoelectrics by the thermal wave method
Suchaneck, G. S., Eydam, A., Wenguo Hu, Kranz, B. K., Drossel, Welf-Guntram, Gerlach, G.
Published in IEEE transactions on ultrasonics, ferroelectrics, and frequency control (01.09.2012)
Published in IEEE transactions on ultrasonics, ferroelectrics, and frequency control (01.09.2012)
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Journal Article
Conference Proceeding
Study microstructures of IC and vacuum nanoelectron devices with electron beam nondestructively microscopically layered endoscopy detecting
Wenguo Hu, Xinliang Fei, Mingguang Chen, Lin Xiao, Zhuguang Liang, Rau, E.I., Kailin Zhou, Jian Wang, Dechun Lan, Ping Li
Published in 2009 22nd International Vacuum Nanoelectronics Conference (01.07.2009)
Published in 2009 22nd International Vacuum Nanoelectronics Conference (01.07.2009)
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Conference Proceeding
Detecting defects of vacuum nanoelectron devices and IC based on penetrate insulating layer non-destructive endoscopy method in SEM
Wenguo Hu, Mingguang Chen, Xinliang Fei, Lin Xiao, Zhuguang Liang, Rau, E.I., Kailin Zhou, Jian Wang, Dechun Lan, Ping Li
Published in 2009 22nd International Vacuum Nanoelectronics Conference (01.07.2009)
Published in 2009 22nd International Vacuum Nanoelectronics Conference (01.07.2009)
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Conference Proceeding
Study on SBD by SEM with penetrating surface method compared to EBIC method
Wenguo Hu, Yiping Lin, Zhuguan Liang, Ling Xiao, Kailin Zhou, Yawen Li, Ping Li, Xinghua Hu, Jian Wang, Rau, E.I.
Published in 2005 International Vacuum Nanoelectronics Conference (2005)
Published in 2005 International Vacuum Nanoelectronics Conference (2005)
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Conference Proceeding
Application of SEM with microscopic computer tomography (MCT) to detect multilayer structure IC and VNED
Zhuguan Liang, Ling Xiao, Yiping Lin, Wenguo Hu, Yawen Li, Kailin Zhou, Xinghua Hu, Ping Li, Jian Wang, Rau, E.I.
Published in 2005 International Vacuum Nanoelectronics Conference (2005)
Published in 2005 International Vacuum Nanoelectronics Conference (2005)
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Conference Proceeding
Study on the Internal Damage of Semiconductor Devices and External Damage of Insulator Layers
Hu, Wenguo, Lin, Yiping, Liang, Zhuguan, Xiao, Ling, Li, Yawen, Li, Ping, Wang, Jian, Zhou, Kailin, Rau, E.I.
Published in 2006 19th International Vacuum Nanoelectronics Conference (01.07.2006)
Published in 2006 19th International Vacuum Nanoelectronics Conference (01.07.2006)
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Conference Proceeding
Study of Application Penetrating Surface Method in SEM to Detect IC with Insulator Layer Si3N4+ SiO2
Hu, Wenguo, Xiao, Ling, Lin, Yiping, Liang, Zhuguan, Li, Yawen, Li, Ping, Lan, Dechun, Wang, Jian, Zhou, Kailin, Rau, E.I.
Published in 2006 19th International Vacuum Nanoelectronics Conference (01.07.2006)
Published in 2006 19th International Vacuum Nanoelectronics Conference (01.07.2006)
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Conference Proceeding