by Liao, Guan-Jr, Wen-Hao Hsueh, Yu-Hsiang, Yen, Yi-Chan, Shih, Wang, Chia-Hsin, Jeng-Han, Wang, Meng-Fan, Luo
Published in Physical chemistry chemical physics : PCCP (07.02.2024)

by Liao, Guan-Jr, Hsueh, Wen-Hao, Yen, Yu-Hsiang, Shih, Yi-Chan, Wang, Chia-Hsin, Wang, Jeng-Han, Luo, Meng-Fan
Published in The Journal of chemical physics (07.05.2023)

by Salamanca, Eisner, Pan, Yu-Hwa, Sun, Ying-Sui, Hsueh, Hao-Wen, Dorj, Odontuya, Yao, Wan-Ling, Lin, Jerry Chin-Yi, Teng, Nai-Chia, Watanabe, Ikki, Abe, Shinichi, Wu, Yi-Fan, Chang, Wei-Jen
Published in International journal of molecular sciences (02.02.2022)

by Hsueh, Hao-Wen, Hung, Fei-Yi, Lui, Truan-Sheng, Chen, Li-Hui
Published in Microelectronics and reliability (01.08.2013)

by Hsueh, Hao-Wen, Hung, Fei-Yi, Lui, Truan-Sheng, Chen, Li-Hui, Chang, Jun-Kai
Published in Microelectronics and reliability (01.11.2014)

by Hsueh, Hao-Wen, Hung, Fei-Yi, Lui, Truan-Sheng, Chen, Li-Hui
Published in Microelectronics and reliability (01.12.2011)

by Chen, Li-Hui, Lui, Truan-Sheng, Hung, Fei-Yi, Hsueh, Hao-Wen, Chen, Kuan-Jen
Published in Advances in materials science and engineering (01.01.2014)

by Tseng, Yi-Wei, Hung, Fei-Yi, Lui, Truan-Sheng, Chen, Mei-Yu, Hsueh, Hao-Wen
Published in Microelectronics and reliability (01.07.2015)

by Hung, Fei-Yi, Lui, Truan-Sheng, Chen, Li-Hui, Hsueh, Hao-Wen
Published in Microelectronics and reliability (2011)

by Huang, I-Ting, Hung, Fei-Yi, Lui, Truan-Sheng, Chen, Li-Hui, Hsueh, Hao-Wen
Published in Microelectronics and reliability (2011)

by Liao, Guan-Jr, Hsueh, Wen-Hao, Yen, Yu-Hsiang, Shih, Yi-Chan, Wang, Chia-Hsin, Wang, Jeng-Han, Luo, Meng-Fan
Published in Physical chemistry chemical physics : PCCP (07.02.2024)

by Liao, Guan-Jr, Hsueh, Wen-Hao, Yen, Yu-Hsiang, Shih, Yi-Chan, Wang, Chia-Hsin, Wang, Jeng-Han, Luo, Meng-Fan
Published in Physical chemistry chemical physics : PCCP (07.02.2024)

by HUANG, I-Ting, HUNG, Fei-Yi, LUI, Truan-Sheng, CHEN, Li-Hui, HSUEH, Hao-Wen
Published in Microelectronics and reliability (2011)

by HUNG, Fei-Yi, LUI, Truan-Sheng, CHEN, Li-Hui, HSUEH, Hao-Wen
Published in Microelectronics and reliability (2011)

by Hao-Wen Hsueh, Fei-Yi Hung, Truan-Sheng Lui, Li-Hui Chen
Published in 2015 European Microelectronics Packaging Conference (EMPC) (01.09.2015)

by Ren Jianguo, Hsueh Wen-hao, Dai Chong, Huang Shang-Bin, Gao Fengguo
Year of Publication 03.01.2017

by GAO FENGGUO, REN JIANGUO, HSUEH WEN-HAO, DAI CHONG, HUANG SHANG-BIN
Year of Publication 01.10.2015

by WEN-HAO HSUEH, SHANG-BIN HUANG, CHONG DAI, JIANGUO REN, FENGGUO GAO
Year of Publication 30.09.2015

by HSUEH WEN-HAO, CHIU YOU-MING
Year of Publication 27.09.2005

by Chiu, You-Ming, Hsueh, Wen-Hao
Year of Publication 27.09.2005