Stress analysis of polycrystalline thin films and surface regions by X-ray diffraction
Ligot, J., Welzel, U., Lamparter, P., Vermeulen, A. C., Mittemeijer, E. J.
Published in Journal of applied crystallography (01.02.2005)
Published in Journal of applied crystallography (01.02.2005)
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Journal Article
The crystallographic growth directions of Sn whiskers
Stein, J., Welzel, U., Leineweber, A., Huegel, W., Mittemeijer, E.J.
Published in Acta materialia (01.03.2015)
Published in Acta materialia (01.03.2015)
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Journal Article
The thermal stability of Ni–Mo and Ni–W thin films: Solute segregation and planar faults
Kurz, S.J.B., Ensslen, C., Welzel, U., Leineweber, A., Mittemeijer, E.J.
Published in Scripta materialia (01.07.2013)
Published in Scripta materialia (01.07.2013)
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Journal Article
Stress Relaxation Mechanisms of Sn and SnPb Coatings Electrodeposited on Cu: Avoidance of Whiskering
Sobiech, M., Teufel, J., Welzel, U., Mittemeijer, E. J., Hügel, W.
Published in Journal of electronic materials (01.11.2011)
Published in Journal of electronic materials (01.11.2011)
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Journal Article
Measurement of X-ray diffraction-line broadening induced by elastic mechanical grain interaction
Koker, M. K. A., Welzel, U., Mittemeijer, E. J.
Published in Journal of applied crystallography (01.02.2014)
Published in Journal of applied crystallography (01.02.2014)
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Journal Article
Elastic anisotropy of γ'-Fe4N and elastic grain interaction in γ'-Fe4N1-y layers on α-Fe : First-principles calculations and diffraction stress measurements
GRESSMANN, T, WOHLSCHLÖGEL, M, SHANG, S, WELZEL, U, LEINEWEBER, A, MITTEMEIJER, E. J, LIU, Z.-K
Published in Acta materialia (01.10.2007)
Published in Acta materialia (01.10.2007)
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Journal Article
The Role of Silver in Mitigation of Whisker Formation on Thin Tin Films
Stein, J., Rehm, S., Welzel, U., Huegel, W., Mittemeijer, E. J.
Published in Journal of electronic materials (01.11.2014)
Published in Journal of electronic materials (01.11.2014)
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Journal Article
Site-Selective Deposition of Nanostructured ZnO Thin Films from Solutions Containing Polyvinylpyrrolidone
Lipowsky, P., Hoffmann, R. C., Welzel, U., Bill, J., Aldinger, F.
Published in Advanced functional materials (03.09.2007)
Published in Advanced functional materials (03.09.2007)
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Journal Article
Interdiffusion and stress development in Cu–Pd thin film diffusion couples
Kuru, Y., Wohlschlögel, M., Welzel, U., Mittemeijer, E.J.
Published in Thin solid films (01.09.2008)
Published in Thin solid films (01.09.2008)
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Journal Article
Coefficients of thermal expansion of thin metal films investigated by non-ambient X-ray diffraction stress analysis
Kuru, Y., Wohlschlögel, M., Welzel, U., Mittemeijer, E.J.
Published in Surface & coatings technology (25.02.2008)
Published in Surface & coatings technology (25.02.2008)
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Journal Article
Conference Proceeding
The lattice parameter of nanocrystalline Ni as function of crystallite size
Sheng, J., Rane, G., Welzel, U., Mittemeijer, E.J.
Published in Physica. E, Low-dimensional systems & nanostructures (01.04.2011)
Published in Physica. E, Low-dimensional systems & nanostructures (01.04.2011)
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Journal Article