Enhanced angular current intensity from Schottky emitters
FUJITA, S, WELLS, T.R.C, USHIO, W, SATO, H, EL-GOMATI, M.M
Published in Journal of microscopy (Oxford) (01.09.2010)
Published in Journal of microscopy (Oxford) (01.09.2010)
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Imaging of doped Si in low and very low voltage SEM: the contrast interpretation
Jayakody, G.H., Wells, T.R.C., El-Gomati, M.M.
Published in Journal of electron spectroscopy and related phenomena (01.05.2005)
Published in Journal of electron spectroscopy and related phenomena (01.05.2005)
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Journal Article