A Method to Improve Reliability in a 65-nm SRAM PUF Array
Shifman, Yizhak, Miller, Avi, Keren, Osnat, Weizmann, Yoav, Shor, Joseph
Published in IEEE solid-state circuits letters (01.06.2018)
Published in IEEE solid-state circuits letters (01.06.2018)
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Journal Article
Methodologies for Device Characterization in Cryogenic Temperatures
Roknian, Noam, Shoshan, Yonatan, Stanger, Inbal, Goldzweig, Menachem, Weizmann, Yoav, Teman, Adam, Charbon, Edoardo, Fish, Alexander
Published in 2024 19th Conference on Ph.D Research in Microelectronics and Electronics (PRIME) (09.06.2024)
Published in 2024 19th Conference on Ph.D Research in Microelectronics and Electronics (PRIME) (09.06.2024)
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Conference Proceeding