A novel scan chain diagnostics technique based on light emission from leakage current
Song, P., Stellari, F., Xia, T., Weger, A.J.
Published in 2004 International Conferce on Test (2004)
Published in 2004 International Conferce on Test (2004)
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Conference Proceeding
Keeping hot chips cool: are IC thermal problems hot air?
Puri, Ruchir, Varma, Devadas, Edwards, Darvin, Weger, Alan J, Franzon, Paul, Yang, Andrew, Kosonocky, Stephen
Published in 2008 45th ACM/IEEE Design Automation Conference (08.06.2008)
Published in 2008 45th ACM/IEEE Design Automation Conference (08.06.2008)
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Conference Proceeding
A Position-Sensitive, Single-Photon Detector with Enhanced NIR Response
Stellari, Franco, Song, Peilin, Weger, Alan J, Nakamura, Tomonori, Kim, Stanley, Roche, Robert
Published in Illumina Technology Records - unstructured (01.01.2011)
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Published in Illumina Technology Records - unstructured (01.01.2011)
Journal Article
The clock distribution of the POWER4 microprocessor
Restle, P.J., Carter, C.A., Eckhardt, J.P., Krauter, B.L., McCredie, B.D., Jenkins, K.A., Weger, A.J., Mule, A.V.
Published in 2002 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.02CH37315) (2002)
Published in 2002 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.02CH37315) (2002)
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Conference Proceeding
Journal Article
Self-heating characterization of FinFET SOI devices using 2D time resolved emission measurements
Stellari, Franco, Jenkins, Keith A., Weger, Alan J., Linder, Barry, Song, Peilin
Published in 2015 IEEE International Reliability Physics Symposium (01.04.2015)
Published in 2015 IEEE International Reliability Physics Symposium (01.04.2015)
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Conference Proceeding
Estimating transistor channel temperature using time-resolved and time-integrated NIR emission
Stellari, Franco, Weger, Alan J., Jenkins, Keith A., Rosa, Giuseppe La, Linder, Barry, Song, Peilin
Published in 2018 IEEE International Reliability Physics Symposium (IRPS) (01.03.2018)
Published in 2018 IEEE International Reliability Physics Symposium (IRPS) (01.03.2018)
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Conference Proceeding
A Thermal Simulation Process Based on Electrical Modeling for Complex Interconnect, Packaging, and 3DI Structures
Lijun Jiang, Chuan Xu, Rubin, B J, Weger, A J, Deutsch, A, Smith, H, Caron, A, Banerjee, K
Published in IEEE transactions on advanced packaging (01.11.2010)
Published in IEEE transactions on advanced packaging (01.11.2010)
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Journal Article
Time-integrated photon emission as a function of temperature in 32 nm CMOS
Shehata, Andrea Bahgat, Weger, Alan J., Stellari, Franco, Song, Peilin, Deslandes, Herve, Lundquist, Ted, Ramsay, Euan
Published in 2015 IEEE International Reliability Physics Symposium (01.04.2015)
Published in 2015 IEEE International Reliability Physics Symposium (01.04.2015)
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Conference Proceeding
Power management of multi-core chips: challenges and pitfalls
Bose, Pradip, Buyuktosunoglu, Alper, Darringer, John A., Gupta, Meeta S., Healy, Michael B., Jacobson, Hans, Nair, Indira, Rivers, Jude A., Shin, Jeonghee, Vega, Augusto, Weger, Alan J.
Published in Proceedings of the Conference on Design, Automation and Test in Europe (12.03.2012)
Published in Proceedings of the Conference on Design, Automation and Test in Europe (12.03.2012)
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Conference Proceeding
Thermal imaging and power mapping at IBM
Weger, A. J., Wakil, J., Hamann, H. F.
Published in 13th InterSociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (01.05.2012)
Published in 13th InterSociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (01.05.2012)
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Conference Proceeding
Power management of multi-core chips: Challenges and pitfalls
Bose, P., Buyuktosunoglu, A., Darringer, J. A., Gupta, M. S., Healy, M. B., Jacobson, H., Nair, I., Rivers, J. A., Shin, J., Vega, A., Weger, A. J.
Published in 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.03.2012)
Published in 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.03.2012)
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Conference Proceeding
Near-infrared photon emission spectroscopy of a 45 nm SOI ring oscillator
Kindereit, U., Weger, A. J., Stellari, F., Peilin Song, Deslandes, H., Lundquist, T., Sabbineni, P.
Published in 2012 IEEE International Reliability Physics Symposium (IRPS) (01.04.2012)
Published in 2012 IEEE International Reliability Physics Symposium (IRPS) (01.04.2012)
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Conference Proceeding
Development of a flexible chip infrared (IR) thermal imaging system for product qualification
Chenzhou Lian, Knox, M., Sikka, K., Xiaojin Wei, Weger, A. J.
Published in 2012 28th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) (01.03.2012)
Published in 2012 28th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) (01.03.2012)
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Conference Proceeding
Product Yield Prediction System and Critical Area Database
Barnett, T.S., Bickford, J.P., Weger, A.J.
Published in IEEE transactions on semiconductor manufacturing (01.08.2008)
Published in IEEE transactions on semiconductor manufacturing (01.08.2008)
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Journal Article
Mapping systematic and random process variations using Light emission from Off-State Leakage
Stellari, F., Song, P., Weger, A.J., Miles, D.L.
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
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Conference Proceeding