IAT Armature Development
McNab, Ian R, Crawford, M T, Satapathy, S S, Stefani, F, Watt, T J
Published in IEEE transactions on plasma science (01.01.2011)
Published in IEEE transactions on plasma science (01.01.2011)
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Journal Article
Cracking and Dominant Stresses in the Throat Region of C-Shaped Solid Armatures
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Journal Article
Conference Proceeding
Microstructures in the Throat Region of Recovered Aluminum-Alloy Armatures
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Journal Article
Conference Proceeding
Investigation Into the Behavior of Armature Ejecta in Electromagnetic Launchers
Wetz, David A, Watt, T J, Surls, D, Crawford, M T
Published in IEEE transactions on plasma science (01.03.2011)
Published in IEEE transactions on plasma science (01.03.2011)
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Journal Article
Characterization of surface mobility in MOS structures containing interfacial cesium ions
Watt, J.T., Fishbein, B.J., Plummer, J.D.
Published in IEEE transactions on electron devices (01.01.1989)
Published in IEEE transactions on electron devices (01.01.1989)
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Journal Article
A low-temperature NMOS technology with Cesium-implanted load devices
Watt, J.T., Fishbein, B.J., Plummer, J.D.
Published in IEEE transactions on electron devices (01.01.1987)
Published in IEEE transactions on electron devices (01.01.1987)
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Journal Article
Characterization and simulation of NMOS pass transistor reliability for FPGA routing circuits
Chen, C. S., Watt, J. T.
Published in 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) (01.03.2013)
Published in 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) (01.03.2013)
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Conference Proceeding
Time resolved annealing of interface traps in polysilicon gate metal-oxide silicon capacitors
FISHBEIN, B. J, WATT, J. T, PLUMMER, J. D
Published in Journal of the Electrochemical Society (01.03.1987)
Published in Journal of the Electrochemical Society (01.03.1987)
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Journal Article