A placer that is used for analysis of TEM sample inefficacy nature
LIU YAN, SU GENGXIAN, WANG JIONGCHONG, HE YONGQIANG, WANG LIANG, CHEN YUE
Year of Publication 01.02.2017
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Year of Publication 01.02.2017
Patent
Novel TEM sample preparation method for analyzing lattice imperfection in failure analysis
LIU YAN, SU GENGXIAN, WANG JIONGCHONG, HE YONGQIANG, WANG LIANG, CHEN YUE
Year of Publication 12.10.2016
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Year of Publication 12.10.2016
Patent
Novel method for enhancing P-junction dyeing effect under low temperature by means of newly-matched acid solution
Liu Yan, Wang Liang, He Yongqiang, Wang Jiongchong, Su Gengxian, Chen Yue
Year of Publication 17.08.2016
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Year of Publication 17.08.2016
Patent