Study of Biased Temperature Instabilities in LDMOST technologies
Tao, Guoqiao, Koster, R., Romanescu, A., Theeuwen, S., van Dalen, R., Bosch, H., Wang, Tsung-Miau, Chen, Shih-Yuan, Jhuang, Yu-Fei, Cheng, Yung-Wen
Published in 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2018)
Published in 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2018)
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Conference Proceeding
Quality Improvement and Electrical characteristics of High-k Films after Receiving Direct Superimposed with Alternative Current Anodic Oxidation (DAC-ANO) Compensation
Chang, Chia-Hua, Wang, Tsung-Miau, Hwu, Jenn-Gwo
Published in Meeting abstracts (Electrochemical Society) (17.02.2006)
Published in Meeting abstracts (Electrochemical Society) (17.02.2006)
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Journal Article