Statistical Analysis of Bit-Errors Distribution for Reliability of 3-D NAND Flash Memories
Wang, Nian-Jia, Lee, Kuan-Yi, Lin, Hsin-Yi, Hsiao, Wei-Hao, Lee, Ming-Yi, Kuo, Li-Kuang, Lin, Ding-Jhang, Chao, Yen-Hai, Lu, Chih-Yuan
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)
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Conference Proceeding
Modeling of Apparent Activation Energy and Lifetime Estimation for Retention of 3D SGVC Memory
Hsiao, Wei-Hao, Wang, Nian-Jia, Lee, Ming-Yi, Kuo, Li-Kuang, Lin, Ding-Jhang, Chao, Yen-Hai, Lu, Chih-Yuan
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
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Conference Proceeding
Endovascular treatment of Budd-Chiari syndrome
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Published in Chinese medical journal (01.10.2011)
Published in Chinese medical journal (01.10.2011)
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Journal Article