Mapping the field of microbial fuel cell: A quantitative literature review (1970–2020)
Naseer, Muhammad Nihal, Zaidi, Asad A., Khan, Hamdullah, Kumar, Sagar, Owais, Muhammad Taha bin, Jaafar, Juhana, Suhaimin, Nuor Sariyan, Wahab, Yasmin Abdul, Dutta, Kingshuk, Asif, Muhammad, Hatta, S.F. Wan Muhamad, Uzair, Muhammad
Published in Energy reports (01.11.2021)
Published in Energy reports (01.11.2021)
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Journal Article
Performance analysis of indium antimonide thermophotovoltaic system with varied material and geometrical properties
Mohd Jasni, M.S., Choong, J.S., Wan Abd Rashid, W.E.S., Abdul Wahab, Y., Wan Muhamad Hatta, S.F.
Published in Microelectronics and reliability (01.11.2021)
Published in Microelectronics and reliability (01.11.2021)
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Journal Article
NBTI degradation effect on advanced-process 45 nm high- k PMOSFETs with geometric and process variations
Hatta, S.F. Wan Muhamad, Soin, N., Hadi, D. Abd, Zhang, J.F.
Published in Microelectronics and reliability (01.11.2010)
Published in Microelectronics and reliability (01.11.2010)
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Journal Article
Conference Proceeding
On the effects of NBTI degradation in p-MOSFET devices
Hussin, H., Soin, N., Karim, N.M., Wan Muhamad Hatta, S.F.
Published in Physica. B, Condensed matter (01.08.2012)
Published in Physica. B, Condensed matter (01.08.2012)
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Journal Article
Conference Proceeding
Negative bias temperature instability characterization and lifetime evaluations of submicron pMOSFET
Wan Muhamad Hatta, S.F., Hussin, H., Soon, F.Y., Wahab, Y. Abdul, Hadi, D. Abdul, Soin, N., Zahirul Alam, A.H.M., Nordin, A.N.
Published in 2017 IEEE Symposium on Computer Applications & Industrial Electronics (ISCAIE) (01.04.2017)
Published in 2017 IEEE Symposium on Computer Applications & Industrial Electronics (ISCAIE) (01.04.2017)
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Conference Proceeding
Comparison of DC and pulse train analysis on submicrometer pMOSFETs lifetime prediction using on-the-fly method
Khafit, I.N. Abdullah, Alimin, A.F. Muhammad, Muhamad Hatta, S.F. Wan, Soin, N.
Published in 2015 IEEE Regional Symposium on Micro and Nanoelectronics (RSM) (01.08.2015)
Published in 2015 IEEE Regional Symposium on Micro and Nanoelectronics (RSM) (01.08.2015)
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Conference Proceeding
Effect of oxide thickness on 32nm Pmosfet reliability
Hadi, D A, Wan Muhamad Hatta, S F, Soin, N
Published in 2010 IEEE International Conference on Semiconductor Electronics (ICSE2010) (01.06.2010)
Published in 2010 IEEE International Conference on Semiconductor Electronics (ICSE2010) (01.06.2010)
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Conference Proceeding