Effect of high temperature aging on reliability of automotive electronics
Yang, D.G., Wan, F.F., Shou, Z.Y., van Driel, W.D., Scholten, H., Goumans, L., Faria, R.
Published in Microelectronics and reliability (01.09.2011)
Published in Microelectronics and reliability (01.09.2011)
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Conference Proceeding
Fabrication and Characterization of Thermally Insulating Polyurethane-Silica Aerogel Composite for Cryogenic Application
Nuhu, I., Halim, Z. A. A., Awang, N., Yajid, M. A. M., Wan Ali, W. F. F.
Published in SILICON (01.06.2024)
Published in SILICON (01.06.2024)
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