by Michael, Joseph R., Perry, Daniel L., Cummings, Damion P., Walraven, Jeremy A., Jordan, Matthew B.
Published in Microscopy and microanalysis (22.03.2022)

by Perry, Daniel L., Cummings, Damion P., Walraven, Jeremy A., Jordan, Matthew B., Michael, Joseph R., Deitz, Julia I.
Published in Microscopy and microanalysis (01.08.2022)

by de Boer, M.P., Luck, D.L., Ashurst, W.R., Maboudian, R., Corwin, A.D., Walraven, J.A., Redmond, J.M.
Published in Journal of microelectromechanical systems (01.02.2004)

by Tanner, D.M., Parson, T.B., Corwin, A.D., Walraven, J.A., Wittwer, J.W., Boyce, B.L., Winzer, S.R.
Published in Microelectronics and reliability (01.09.2007)

by Walraven, J.A.
Published in International Test Conference, 2003. Proceedings. ITC 2003 (2003)

by Walraven, Jeremy A
Published in Electronic device failure analysis (01.02.2012)

by Walraven, Jeremy A
Published in Electronic device failure analysis (01.02.2013)

by Walraven, J.A.
Published in International Test Conference, 2003. Proceedings. ITC 2003 (2003)

by Walraven, J.A.
Published in International Test Conference, 2003. Proceedings. ITC 2003 (2003)

by Walraven, J.A.
Published in International Test Conference, 2003. Proceedings. ITC 2003 (2003)

by Tanner, D.M., Walraven, J.A., Dugger, M.T., Parson, T.B., Candelaria, S.A., Jenkins, M.W., Corwin, A.D., Ohlhausen, J.A., Huffman, E.M.
Published in 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual (2005)

by Tanner, D.M., Swanson, S.E., Walraven, J.A., Dohner, J.L.
Published in 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual (2003)

by Tanner, D.M., Walraven, J.A., Mani, S.S., Swanson, S.E.
Published in 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) (2002)

by Walraven, Jeremy A, Cole, Jr., Edward I
Year of Publication 18.06.2002

by Walraven, Jeremy A
Published in Electronic device failure analysis (01.11.2014)

by Walraven, Jeremy A
Published in Electronic device failure analysis (01.08.2009)

by Walraven, Jeremy A
Published in Electronic device failure analysis (01.02.2009)

by Jenkins, Mark W, Cole, Jr, Edward I, Tangyunyong, Paiboon, Soden, Jerry M, Walraven, Jeremy A, Pimentel, Alejandro A
Year of Publication 28.04.2009

by COLE, JR. EDWARD I, PIMENTEL ALEJANDRO A, WALRAVEN JEREMY A, JENKINS MARK W, TANGYUNYONG PAIBOON, SODEN JERRY M
Year of Publication 28.04.2009

by COLE, JR. EDWARD I, WALRAVEN JEREMY A
Year of Publication 18.06.2002