A multi-factorial approach for middle-of-line design rule validation and optimization in 22FDX
Ramadout, Benoit, Wehella-Gamage, Deepal, Staiger, Thomas, Babich, Katherina, Moll, Hans-Peter, Wallner, Jin, Patterson, Oliver D.
Published in 2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.04.2018)
Published in 2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.04.2018)
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Conference Proceeding
Bilayer Silicon Nitride Based On-chip Polarization Rotator for O-band Photonic Applications
Hossain, Mohammad Jobayer, Rakib Uddin, Mohammad, Carpenter, Lewis G., Dikshit, Amit, Wallner, Jin, Mann, Javery A., Fahrenkopf, Nicholas M., Harame, David L.
Published in 2023 IEEE Photonics Conference (IPC) (12.11.2023)
Published in 2023 IEEE Photonics Conference (IPC) (12.11.2023)
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Conference Proceeding
Compact Modeling of Key Passive Silicon Photonic Components for a Process Design Kit
Hossain, Mohammad Jobayer, Dikshit, Amit, Wallner, Jin, Uddin, Mohammad Rakib, Timalsina, Yukta, Carpenter, Lewis G., Mann, Javery, Fahrenkopf, Nicholas M., Harame, David L.
Published in 2023 IEEE Photonics Conference (IPC) (12.11.2023)
Published in 2023 IEEE Photonics Conference (IPC) (12.11.2023)
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Conference Proceeding
AIM Photonics Design Enablement: A Design-Assembly-Test Platform Advancing the Silicon-Photonics Ecosystem
Dikshit, Amit, Wallner, Jin, Hossain, M. Jobayer, Rakib Uddin, M., Mann, Javery, Aiello, Anthony, Carpenter, Lewis G., Timalsina, Yukta, McDonough, Colin, Fahrenkopf, Nick, Leake, Gerald, Baiocco, Christopher, Striemer, Christopher, Halepis, Maria, Coleman, Daniel, Begovic, Amir, Yang, Hao, Zylstra, Michael, Jahn, Jerome, Goldstein, Jordan, Poulton, Christopher V., Stievater, Todd, Tyndall, Nathan, Fanto, Michael, Harame, David
Published in 2024 Optical Fiber Communications Conference and Exhibition (OFC) (24.03.2024)
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Published in 2024 Optical Fiber Communications Conference and Exhibition (OFC) (24.03.2024)
Conference Proceeding
Pattern Matching Rule Ranking through Design of Experiments and Silicon Validation
ASM International
Published in ISTFA™ 2018 - Conference Proceedings from the 44th International Symposium for Testing and Failure Analysis, October 28-November 1, 2018, Phoenix Convention Center, Phoenix, Arizona, USA (2018)
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Published in ISTFA™ 2018 - Conference Proceedings from the 44th International Symposium for Testing and Failure Analysis, October 28-November 1, 2018, Phoenix Convention Center, Phoenix, Arizona, USA (2018)
Book Chapter