Machine learning force field for thermal oxidation of silicon
Cvitkovich, Lukas, Fehringer, Franz, Wilhelmer, Christoph, Milardovich, Diego, Waldhör, Dominic, Grasser, Tibor
Published in The Journal of chemical physics (14.10.2024)
Published in The Journal of chemical physics (14.10.2024)
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Journal Article
Perspective of 2D Integrated Electronic Circuits: Scientific Pipe Dream or Disruptive Technology?
Waltl, Michael, Knobloch, Theresia, Tselios, Konstantinos, Filipovic, Lado, Stampfer, Bernhard, Hernandez, Yoanlys, Waldhör, Dominic, Illarionov, Yury, Kaczer, Ben, Grasser, Tibor
Published in Advanced materials (Weinheim) (01.12.2022)
Published in Advanced materials (Weinheim) (01.12.2022)
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Journal Article
Origin of trap assisted tunnelling in ammonia annealed SiC trench MOSFETs
Berens, Judith, Mistry, Manesh V., Waldhör, Dominic, Shluger, Alexander, Pobegen, Gregor, Grasser, Tibor
Published in Microelectronics and reliability (01.12.2022)
Published in Microelectronics and reliability (01.12.2022)
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Journal Article
Dynamic modeling of Si(100) thermal oxidation: Oxidation mechanisms and realistic amorphous interface generation
Cvitkovich, Lukas, Waldhör, Dominic, El-Sayed, Al-Moatassem, Jech, Markus, Wilhelmer, Christoph, Grasser, Tibor
Published in Applied surface science (01.02.2023)
Published in Applied surface science (01.02.2023)
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Journal Article
Lifetime Projection of Bipolar Operation of SiC DMOSFET
Grasser, Tibor, Waldhoer, Dominic, Waltl, Michael, Schleich, Christian, Vasilev, Aleksandr, Feil, Maximilian Wolfgang
Published in Materials science forum (05.06.2023)
Published in Materials science forum (05.06.2023)
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Journal Article
Electrically stimulated optical spectroscopy of interface defects in wide-bandgap field-effect transistors
Feil, Maximilian W., Reisinger, Hans, Kabakow, André, Aichinger, Thomas, Schleich, Christian, Vasilev, Aleksandr, Waldhör, Dominic, Waltl, Michael, Gustin, Wolfgang, Grasser, Tibor
Published in Communications engineering (31.01.2023)
Published in Communications engineering (31.01.2023)
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Journal Article
Single- Versus Multi-Step Trap Assisted Tunneling Currents-Part I: Theory
Schleich, Christian, Waldhor, Dominic, Knobloch, Theresia, Zhou, Weifeng, Stampfer, Bernhard, Michl, Jakob, Waltl, Michael, Grasser, Tibor
Published in IEEE transactions on electron devices (01.08.2022)
Published in IEEE transactions on electron devices (01.08.2022)
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Journal Article
Machine Learning Force Field for Thermal Oxidation of Silicon
Cvitkovich, Lukas, Fehringer, Franz, Wilhelmer, Christoph, Milardovich, Diego, Waldhör, Dominic, Grasser, Tibor
Published in arXiv.org (22.05.2024)
Published in arXiv.org (22.05.2024)
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Paper
Journal Article
Coherence limit due to hyperfine interaction with nuclei in the barrier material of Si spin qubits
Cvitkovich, Lukas, Stano, Peter, Wilhelmer, Christoph, Waldhör, Dominic, Loss, Daniel, Niquet, Yann-Michel, Grasser, Tibor
Year of Publication 17.05.2024
Year of Publication 17.05.2024
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Journal Article
Single- Versus Multi-Step Trap Assisted Tunneling Currents-Part II: The Role of Polarons
Schleich, Christian, Waldhor, Dominic, El-Sayed, Al-Moatasem, Tselios, Konstantinos, Kaczer, Ben, Grasser, Tibor, Waltl, Michael
Published in IEEE transactions on electron devices (01.08.2022)
Published in IEEE transactions on electron devices (01.08.2022)
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Journal Article
Modeling the Initial Stages of Si(100) Thermal Oxidation: An Ab-initio Approach
Cvitkovich, Lukas, Waldhör, Dominic, El-Sayed, Al-Moatassem, Jech, Markus, Wilhelmer, Christoph, Grasser, Tibor
Published in arXiv.org (15.09.2022)
Published in arXiv.org (15.09.2022)
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Paper
Journal Article
Time-Gated Optical Spectroscopy of Field-Effect Stimulated Recombination via Interfacial Point Defects in Fully-Processed Silicon Carbide Power MOSFETs
Feil, Maximilian W, Weger, Magdalena, Reisinger, Hans, Aichinger, Thomas, Kabakow, André, Waldhör, Dominic, Jakowetz, Andreas C, Prigann, Sven, Pobegen, Gregor, Gustin, Wolfgang, Waltl, Michael, Bockstedte, Michel, Grasser, Tibor
Published in arXiv.org (20.04.2024)
Published in arXiv.org (20.04.2024)
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Paper
Journal Article
Modeling the Impact of Interface and Border Traps on Hysteresis in Encapsulated Monolayer MoS2 Based Double Gated FETs
Ghosh, Rittik, Knobloch, Theresia, Karl, Alexander, Wilhelmer, Christoph, Provias, Alexandros, Waldhor, Dominic, Grasser, Tibor
Published in 2024 Austrochip Workshop on Microelectronics (Austrochip) (25.09.2024)
Published in 2024 Austrochip Workshop on Microelectronics (Austrochip) (25.09.2024)
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Conference Proceeding
Modeling Next Generation Sensor Chips: Towards Predictive Band Structure Models for Quarternary III- V Semiconductor Alloys
Gentles, Angus, Dehghani, Mohammad, Minixhofer, Rainer, Khakbaz, Pedram, Waldhor, Dominic, Waltl, Michael
Published in 2024 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (24.09.2024)
Published in 2024 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (24.09.2024)
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Conference Proceeding
First Principles Evaluation of Topologically Protected Edge States in MoS2 1T′ Nanoribbons with Realistic Terminations
El-Sayed, Al-Moatasem, Seiler, Heribert, Kosina, Hans, Jech, Markus, Waldhor, Dominic, Sverdlov, Viktor
Published in 2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS) (01.09.2021)
Published in 2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS) (01.09.2021)
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Conference Proceeding