Improvement of current sensitivity in detecting current-induced magnetic field using magnetic force microscopy
Wakaya, F., Kajiwara, M., Kubo, K., Abo, S., Takai, M.
Published in Microelectronic engineering (01.08.2011)
Published in Microelectronic engineering (01.08.2011)
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Journal Article
Conference Proceeding
Contact resistance of multiwall carbon nanotubes
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Conference Proceeding
Nuclear nanoprobe development for visualization of three-dimensional nanostructures
Takai, M., Abo, S., Wakaya, F., Kikuchi, T., Sawaragi, H.
Published in Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (01.08.2007)
Published in Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (01.08.2007)
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Journal Article
Detection of magnetic field for measuring current distribution in metal nanostructure
Tanaka, K., Mori, Y., Yamagiwa, H., Abo, S., Wakaya, F., Takai, M.
Published in Microelectronic engineering (01.05.2007)
Published in Microelectronic engineering (01.05.2007)
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Journal Article
Conference Proceeding
Transport Properties of Beam-Deposited Pt Nanowires
Wakaya, F, Tsukatani, Y, Yamasaki, N, Murakami, K, Abo, S, Takai, M
Published in Journal of physics. Conference series (10.05.2006)
Published in Journal of physics. Conference series (10.05.2006)
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Journal Article
Dopant profiling of ultra shallow As implanted in Si with and without spike annealing using medium energy ion scattering
Abo, S., Ichihara, S., Lohner, T., Wakaya, F., Eimori, T., Inoue, Y., Takai, M.
Published in Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (01.08.2005)
Published in Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (01.08.2005)
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Journal Article
Fabrication of carbon nanotube devices by electroplating with in situ observation
WAKAYA, F, OGI, Y, YOSHIDA, M, KIMURA, S, TAKAI, M, AKASAKA, Y, GAMO, K
Published in Microelectronic engineering (01.06.2004)
Published in Microelectronic engineering (01.06.2004)
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Journal Article
Fabrication of carbon nanotube devices by electroplating with in situ observation
Wakaya, F., Ogi, Y., Yoshida, M., Kimura, S., Takai, M., Akasaka, Y., Gamo, K.
Published in Microelectronic engineering (01.06.2004)
Published in Microelectronic engineering (01.06.2004)
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Journal Article
Tertiary electrons in single-event time-of-flight Rutherford backscattering spectrometry
Abo, Satoshi, Seidl, Albert, Wakaya, Fujio, Takai, Mikio
Published in Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (01.10.2019)
Published in Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (01.10.2019)
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Journal Article
Formation of narrow grooves on thin metal layer by focused ion beam etching
Yoshida, M., Murakami, S., Nakayama, M., Yanagisawa, J., Wakaya, F., Kaito, T., Gamo, K.
Published in Microelectronic engineering (01.09.2001)
Published in Microelectronic engineering (01.09.2001)
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Conference Proceeding
Capacitively- and resistively-coupled single-electron transistor
Wakaya, F., Mandai, S., Nakamichi, S., Iwabuchi, S., Gamo, K.
Published in Microelectronic engineering (01.06.2000)
Published in Microelectronic engineering (01.06.2000)
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Conference Proceeding
Effects of asymmetric environment on the island charge state of single-electron transistors
Wakaya, F., Iwabuchi, S., Higurashi, H., Nagaoka, Y., Gamo, K.
Published in Microelectronic engineering (01.06.1999)
Published in Microelectronic engineering (01.06.1999)
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Conference Proceeding
Single-electron tunnelling device with variable environmental impedance
Wakaya, F, Yoshioka, F, Iwabuchi, S, Higurashi, H, Nagaoka, Y, Gamo, K
Published in Semiconductor science and technology (01.08.1998)
Published in Semiconductor science and technology (01.08.1998)
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Journal Article
Conference Proceeding
Single-electron transistor controlled by environmental impedance: Effects of capacitive environmental impedance
Wakaya, F., Yoshioka, F., Furuichi, S., Higurashi, H., Iwabuchi, S., Nagaoka, Y., Gamo, K.
Published in Microelectronic engineering (1999)
Published in Microelectronic engineering (1999)
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Conference Proceeding
Magnetization Processes in Narrow and Wide Cross-shaped Co/Cu/NiFe Wires
Kimura, Takashi, Wakaya, Fujio, Gamo, Kenji
Published in Japanese Journal of Applied Physics (01.03.2001)
Published in Japanese Journal of Applied Physics (01.03.2001)
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Journal Article
Effects of growth interruption in in situ process for buried quantum structures
Wakaya, F., Matsubara, T., Nakayama, M., Yanagisawa, J., Yuba, Y., Takaoka, S., Murase, K., Gamo, K., Gamo, K.
Published in Microelectronic engineering (01.03.1998)
Published in Microelectronic engineering (01.03.1998)
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Conference Proceeding
Fabrication of buried quantum structures using FIB-MBE total vacuum process
Wakaya, F., Yanagisawa, J., Matsubara, T., Nakayama, H., Yuba, Y., Takaoka, S., Murase, K., Gamo, K.
Published in Microelectronic engineering (01.02.1997)
Published in Microelectronic engineering (01.02.1997)
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