by Inagaki, K, Narukawa, T, Hioki, A, Miyashita, S, Long, S E, Ellisor, M B, Peng, S L, Dewi, F, Shin, R, Kapp, T, Wai-hong, F, Hei-shing, C, Chao, W, Kaewkhomdee, N, Taebunpakul, S, Thiengmanee, U, Yafa, C
Published in Metrologia (01.01.2017)