C-AFM analysis of advanced IC on SRAM high resistance failure
Wai Tuck Leong, Hong Bo Zhang, Hoe, W. L. C., Ren De Lin
Published in 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (01.07.2012)
Published in 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (01.07.2012)
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Conference Proceeding
Applications of C-AFM analysis techniques at advanced IC on SRAM soft failure
Hong Bo Zhang, Hoe, Wilson Lee Cheng, Ren De Lin, Wai Tuck Leong
Published in 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (01.07.2010)
Published in 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (01.07.2010)
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Conference Proceeding