by Senn, T., Waberski, Ch, Wolf, J., Esquivel, J.P., Sabaté, N., Löchel, B.
Published in Microelectronic engineering (2011)

by Senf, F, Bijkerk, F, Eggenstein, F, Gwalt, G, Huang, Q, Kruijs, R, Kutz, O, Lemke, S, Louis, E, Mertin, M, Packe, I, Rudolph, I, Schäfers, F, Siewert, F, Sokolov, A, Sturm, J M, Waberski, Ch, Wang, Z, Wolf, J, Zeschke, T, Erko, A
Published in Optics express (13.06.2016)

by Siewert, F., Löchel, B., Buchheim, J., Eggenstein, F., Firsov, A., Gwalt, G., Kutz, O., Lemke, St, Nelles, B., Rudolph, I., Schäfers, F., Seliger, T., Senf, F., Sokolov, A., Waberski, Ch, Wolf, J., Zeschke, T., Zizak, I., Follath, R., Arnold, T., Frost, F., Pietag, F., Erko, A.
Published in Journal of synchrotron radiation (01.01.2018)

by Siewert, F, Lochel, B, Buchheim, J, Eggenstein, F, Firsov, A, Gwalt, G, Kutz, O, Lemke, St, Nelles, B, Rudolph, I, Schafers, F, Seliger, T, Senf, F, Sokolov, A, Waberski, Ch, Wolf, J, Zeschke, T, Zizak, I, Follath, R, Arnold, T, Frost, F, Pietag, F, Erko, A
Published in Journal of synchrotron radiation (01.01.2018)