Secure Scan Design through Pseudo Fault Injection
Jang, Seokjun, Woo, Hyungil, Kim, Sunghoon, Kang, Sungho
Published in 2021 18th International SoC Design Conference (ISOCC) (06.10.2021)
Published in 2021 18th International SoC Design Conference (ISOCC) (06.10.2021)
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