Two experimental methods to characterize load capacitance of a CMOS gate
Chen, Kai, Hu, Chenming, Fang, Peng, Lin, Min Ren, Wollesen, Donald L
Published in Semiconductor science and technology (01.07.1998)
Published in Semiconductor science and technology (01.07.1998)
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Journal Article
Predicting CMOS speed with gate oxide and voltage scaling and interconnect loading effects
Chen, K., Hu, C., Fang, P., Lin, M.R., Wollesen, D.L.
Published in IEEE transactions on electron devices (01.11.1997)
Published in IEEE transactions on electron devices (01.11.1997)
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Journal Article