by Wen, Xinlei, Wang, Zhihua, Wu, Qiong, Liu, Chengrui
Published in IEEE access (2019)

by Wen, Xinlei, Wang, Zhihua, Fu, Huimin, Wu, Qiong, Liu, Chengrui
Published in IEEE transactions on reliability (01.12.2019)

by Wang, Zhihua, Wu, Qiong, Zhang, Xiongjian, Wen, Xinlei, Zhang, Yongbo, Liu, Chengrui, Fu, Huimin
Published in Microelectronics and reliability (01.06.2018)

by Wen, Xinlei, Wang, Zhihua, Li, Junxing, Liu, Chengrui, Zhang, Yongbo
Published in Arabian journal for science and engineering (2011) (11.03.2019)

by Liu, Ye, Wang, Ying, Wen, Xinlei, Shimizu, Kazuya, Lei, Zhongfang, Kobayashi, Motoyoshi, Zhang, Zhenya, Sumi, Ikuhiro, Yao, Yasuko, Mogi, Yasuhiro
Published in RSC advances (01.01.2018)

by Liu, Ye, Wang, Ying, Wen, Xinlei, Shimizu, Kazuya, Lei, Zhongfang, Kobayashi, Motoyoshi, Zhang, Zhenya, Sumi, Ikuhiro, Yao, Yasuko, Mogi, Yasuhiro
Year of Publication 25.07.2018

by WEN XINLEI
Year of Publication 15.07.2015

by WEN XINLEI, YE BO, QIN JIAN, MEI WENHUI
Year of Publication 05.12.2023

by FU HUIMIN, WEN XINLEI, FU YUESHUAI
Year of Publication 02.02.2021

by SUN YUYAO, WEN XINLEI, LI WENJIN, ZHANG YUE, SUN LIEWU, LIU HAOTIAN, TAN LESHAN
Year of Publication 20.09.2022

by WEN XINLEI, FEI QINGCHUN, YE BO, QIN JIAN, TANG LEI, LIU JIANXIN
Year of Publication 12.07.2022

by FU HUIMIN, WEN XINLEI, WANG ZHIHUA, ZHANG YONGBO
Year of Publication 16.02.2018

by PAN YUTAO, PAN GEHUA, WEN XINLEI, WEI JIAJUN, JIANG ENWEI, LIANG ZHANXI, LIANG KUN, HE QIRUI, TANG SHILIN
Year of Publication 14.09.2016