Nanoscale CMOS
Wong, H.-S.P., Frank, D.J., Solomon, P.M., Wann, C.H.J., Welser, J.J.
Published in Proceedings of the IEEE (01.04.1999)
Published in Proceedings of the IEEE (01.04.1999)
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Journal Article
Initiation, Development, and Survival of Cleistothecia of Podosphaera aphanis and Their Role in the Epidemiology of Strawberry Powdery Mildew
Gadoury, David M, Asalf, Belachew, Heidenreich, M. Catherine, Herrero, M.L, Welser, M.J, Seem, Robert C, Tronsmo, Anne Marte, Stensvand, Arne
Published in Phytopathology (01.03.2010)
Published in Phytopathology (01.03.2010)
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Journal Article
Room temperature operation of a quantum-dot flash memory
Welser, J.J., Tiwari, S., Rishton, S., Lee, K.Y., Lee, Y.
Published in IEEE electron device letters (01.06.1997)
Published in IEEE electron device letters (01.06.1997)
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Journal Article
Emerging Digital Frontiers for Service Innovation
Peters, Christoph, Maglio, Paul, Badinelli, Ralph, Harmon, Robert R., Maull, Roger, Spohrer, James C., Tuunanen, Tuure, Vargo, Stephen L., Welser, Jeffrey J., Demirkan, Haluk, Griffith, Terri L., Moghaddam, Yassi
Published in Communications of the Association for Information Systems (2016)
Published in Communications of the Association for Information Systems (2016)
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Journal Article
A high-speed, high-sensitivity silicon lateral trench photodetector
Min Yang, Kern Rim, Rogers, D.L., Schaub, J.D., Welser, J.J., Kuchta, D.M., Boyd, D.C., Rodier, F., Rabidoux, P.A., Marsh, J.T., Ticknor, A.D., Qingyun Yang, Upham, A., Ramac, S.C.
Published in IEEE electron device letters (01.07.2002)
Published in IEEE electron device letters (01.07.2002)
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Journal Article
Placental Defects in α7 Integrin Null Mice
Welser, J.V, Lange, N.D, Flintoff-Dye, N, Burkin, H.R, Burkin, D.J
Published in Placenta (Eastbourne) (01.01.2007)
Published in Placenta (Eastbourne) (01.01.2007)
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Journal Article
Small silicon memories: confinement, single-electron,. and interface state considerations
Tiwari, S, Wahl, J A, Silva, H, Rana, F, Welser, J J
Published in Applied physics. A, Materials science & processing (01.10.2000)
Published in Applied physics. A, Materials science & processing (01.10.2000)
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Journal Article
CMOS and memories: From 100 nm to 10 nm
Tiwari, Sandip, Solomon, Paul M., Welser, J.J., Jones, E.C., McFeely, F.R., Cartier, E.
Published in Microelectronic engineering (1999)
Published in Microelectronic engineering (1999)
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Journal Article
Conference Proceeding
Strain dependence of the performance enhancement in strained-Si n-MOSFETs
Welser, J., Hoyt, J.L., Takagi, S., Gibbons, J.F.
Published in International Electron Devices Meeting. I E D M Technical Digest. pp. 373-376. 1994 (1994)
Published in International Electron Devices Meeting. I E D M Technical Digest. pp. 373-376. 1994 (1994)
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Conference Proceeding
Journal Article
Temperature and scaling behavior of strained-Si N-MOSFET's
Welser, J., Hoyt, J.L., Gibbons, J.F.
Published in IEEE transactions on electron devices (01.11.1993)
Published in IEEE transactions on electron devices (01.11.1993)
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Journal Article
Future Computing Hardware for AI
Welser, J., Pitera, J. W., Goldberg, C.
Published in 2018 IEEE International Electron Devices Meeting (IEDM) (01.12.2018)
Published in 2018 IEEE International Electron Devices Meeting (IEDM) (01.12.2018)
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Conference Proceeding