Exploiting don't cares to enhance functional tests
Weiss, M.W., Seth, S.C., Mehta, S.K., Einspahr, K.L.
Published in Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159) (2000)
Published in Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159) (2000)
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Conference Proceeding
Design verification and functional testing of finite state machines
Weiss, M.W., Seth, S.C., Mehta, S.K., Einspahr, K.L.
Published in VLSI Design 2001. Fourteenth International Conference on VLSI Design (2001)
Published in VLSI Design 2001. Fourteenth International Conference on VLSI Design (2001)
Get full text
Conference Proceeding