Persistence Length of Single-Stranded DNA
Tinland, Bernard, Pluen, Alain, Sturm, Jean, Weill, Gilbert
Published in Macromolecules (22.09.1997)
Published in Macromolecules (22.09.1997)
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Journal Article
Characterisation of Si III and Si IV, metastable forms of silicon at ambient pressure
Weill, G, Mansot, J L, Sagon, G, Carlone, C, Besson, J M
Published in Semiconductor science and technology (01.04.1989)
Published in Semiconductor science and technology (01.04.1989)
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Conference Proceeding
Phase relationships in mercury telluride under high temperature and pressure
Grima, P., Polian, A., Gauthier, M., Itié, J.P., Mezouar, M., Weill, G., Besson, J.M., Haüserman, D., Hanfland, H.
Published in The Journal of physics and chemistry of solids (01.03.1995)
Published in The Journal of physics and chemistry of solids (01.03.1995)
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Journal Article
Conference Proceeding
Influence of hydrostatic pressure on the diffusion of hydrogen in n-GaAs : Si
Machayekhi, B., Chevallier, J., Theys, B., Besson, J.M., Weill, G., Syfosse, G.
Published in Solid state communications (01.12.1996)
Published in Solid state communications (01.12.1996)
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X-ray diffraction of γ-Fe at high temperatures and pressures
BOEHLER, R, BESSON, J. M, NICOL, M, NIELSEN, M, ITIE, J. P, WEILL, G, JOHNSON, S, GREY, F
Published in Journal of applied physics (15.02.1989)
Published in Journal of applied physics (15.02.1989)
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