by Jenkins, Keith A., Weger, Alan J.
Published in IEEE electron device letters (01.05.2022)

by Stellari, Franco, Jenkins, Keith A., Weger, Alan J., Linder, Barry P., Peilin Song
Published in IEEE transactions on electron devices (01.05.2016)

by Stellari, F, Peilin Song, Weger, A J
Published in IEEE journal of quantum electronics (01.06.2011)

by Song, P., Stellari, F., Xia, T., Weger, A.J.
Published in 2004 International Conferce on Test (2004)

by Puri, Ruchir, Varma, Devadas, Edwards, Darvin, Weger, Alan J, Franzon, Paul, Yang, Andrew, Kosonocky, Stephen
Published in 2008 45th ACM/IEEE Design Automation Conference (08.06.2008)

by POLONSKY STANISLAV, STELLARI FRANCO, SONG PEILIN, WEGER ALAN J
Year of Publication 08.04.2010

by Stellari, Franco, Song, Peilin, Weger, Alan J, Nakamura, Tomonori, Kim, Stanley, Roche, Robert
Published in Illumina Technology Records - unstructured (01.01.2011)

by Restle, P.J., Carter, C.A., Eckhardt, J.P., Krauter, B.L., McCredie, B.D., Jenkins, K.A., Weger, A.J., Mule, A.V.
Published in 2002 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.02CH37315) (2002)

by Stellari, Franco, Jenkins, Keith A., Weger, Alan J., Linder, Barry, Song, Peilin
Published in 2015 IEEE International Reliability Physics Symposium (01.04.2015)

by Stellari, Franco, Weger, Alan J., Jenkins, Keith A., Rosa, Giuseppe La, Linder, Barry, Song, Peilin
Published in 2018 IEEE International Reliability Physics Symposium (IRPS) (01.03.2018)

by Lijun Jiang, Chuan Xu, Rubin, B J, Weger, A J, Deutsch, A, Smith, H, Caron, A, Banerjee, K
Published in IEEE transactions on advanced packaging (01.11.2010)

by Shehata, Andrea Bahgat, Weger, Alan J., Stellari, Franco, Song, Peilin, Deslandes, Herve, Lundquist, Ted, Ramsay, Euan
Published in 2015 IEEE International Reliability Physics Symposium (01.04.2015)

by BARNETT, Thomas S, BICKFORD, Jeanne P, WEGER, Alan J
Published in IEEE transactions on semiconductor manufacturing (2008)

by Bose, Pradip, Buyuktosunoglu, Alper, Darringer, John A., Gupta, Meeta S., Healy, Michael B., Jacobson, Hans, Nair, Indira, Rivers, Jude A., Shin, Jeonghee, Vega, Augusto, Weger, Alan J.
Published in Proceedings of the Conference on Design, Automation and Test in Europe (12.03.2012)

by Weger, A. J., Wakil, J., Hamann, H. F.
Published in 13th InterSociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (01.05.2012)

by Bose, P., Buyuktosunoglu, A., Darringer, J. A., Gupta, M. S., Healy, M. B., Jacobson, H., Nair, I., Rivers, J. A., Shin, J., Vega, A., Weger, A. J.
Published in 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.03.2012)

by Kindereit, U., Weger, A. J., Stellari, F., Peilin Song, Deslandes, H., Lundquist, T., Sabbineni, P.
Published in 2012 IEEE International Reliability Physics Symposium (IRPS) (01.04.2012)

by Chenzhou Lian, Knox, M., Sikka, K., Xiaojin Wei, Weger, A. J.
Published in 2012 28th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) (01.03.2012)

by Barnett, T.S., Bickford, J.P., Weger, A.J.
Published in IEEE transactions on semiconductor manufacturing (01.08.2008)

by Stellari, F., Song, P., Weger, A.J., Miles, D.L.
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)