Product Yield Prediction System and Critical Area Database
Barnett, T.S., Bickford, J., Weger, A.J.
Published in 2007 IEEE/SEMI Advanced Semiconductor Manufacturing Conference (01.06.2007)
Published in 2007 IEEE/SEMI Advanced Semiconductor Manufacturing Conference (01.06.2007)
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Conference Proceeding
Verification of untrusted chips using trusted layout and emission measurements
Stellari, Franco, Peilin Song, Weger, Alan J., Culp, Jim, Herbert, A., Pfeiffer, D.
Published in 2014 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST) (01.05.2014)
Published in 2014 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST) (01.05.2014)
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Conference Proceeding
Detection of hardware trojan using light emissions with sacrificial mask
Weger, Alan J, Song, Peilin, Bahgat Shehata, Andrea, Stellari, Franco
Year of Publication 04.12.2018
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Year of Publication 04.12.2018
Patent
DETECTION OF HARDWARE TROJAN USING LIGHT EMISSIONS WITH SACRIFICIAL MASK
Weger, Alan J, Song, Peilin, Bahgat Shehata, Andrea, Stellari, Franco
Year of Publication 26.07.2018
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Year of Publication 26.07.2018
Patent
Latchup Analysis Using Emission Microscopy
Stellari, Franco, Song, Peilin, McManus, Moyra K., Weger, Alan J., Gauthier, Robert, Chatty, Kiran V., Muhammad, Mujahid, Sanda, Pia, Wu, Philip, Wilson, Steve
Published in Microelectronics and reliability (01.09.2003)
Published in Microelectronics and reliability (01.09.2003)
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Journal Article
High-Voltage and High-Power PLL Diagnostics using Advanced Cooling and Emission Images
Stellari, F., Song, P., Diemoz, T.E., Weger, A.J., Vogel, T., Wilson, S.C., Pennings, J., Rizzolo, R.F.
Published in 2006 IEEE International Test Conference (01.10.2006)
Published in 2006 IEEE International Test Conference (01.10.2006)
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Conference Proceeding