Robust High-Resistance State and Improved Endurance of HfOX Resistive Memory by Suppression of Current Overshoot
CHEN, Yu-Sheng, LEE, Heng-Yuan, TSAI, Ming-Jinn, LIEN, Chenhsin, CHEN, Pang-Shiu, LIU, Wen-Hsing, WANG, Sum-Min, GU, Pei-Yi, HSU, Yen-Ya, TSAI, Chen-Han, CHEN, Wei-Su, CHEN, Frederick
Published in IEEE electron device letters (01.11.2011)
Published in IEEE electron device letters (01.11.2011)
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A 4Mb embedded SLC resistive-RAM macro with 7.2ns read-write random-access time and 160ns MLC-access capability
Shyh-Shyuan Sheu, Meng-Fan Chang, Ku-Feng Lin, Che-Wei Wu, Yu-Sheng Chen, Pi-Feng Chiu, Chia-Chen Kuo, Yih-Shan Yang, Pei-Chia Chiang, Wen-Pin Lin, Che-He Lin, Heng-Yuan Lee, Pei-Yi Gu, Sum-Min Wang, Chen, F T, Keng-Li Su, Chen-Hsin Lien, Kuo-Hsing Cheng, Hsin-Tun Wu, Tzu-Kun Ku, Ming-Jer Kao, Ming-Jinn Tsai
Published in 2011 IEEE International Solid-State Circuits Conference (01.02.2011)
Published in 2011 IEEE International Solid-State Circuits Conference (01.02.2011)
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Conference Proceeding
AlOx-Based Resistive Switching Device with Gradual Resistance Modulation for Neuromorphic Device Application
Yi Wu, Shimeng Yu, Wong, H.-S Philip, Yu-Sheng Chen, Heng-Yuan Lee, Sum-Min Wang, Pei-Yi Gu, Chen, F., Ming-Jinn Tsai
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Published in 2012 4th IEEE International Memory Workshop (01.05.2012)
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Conference Proceeding
Robust High-Resistance State and Improved Endurance of \hbox Resistive Memory by Suppression of Current Overshoot
Yu-Sheng Chen, Heng-Yuan Lee, Pang-Shiu Chen, Wen-Hsing Liu, Sum-Min Wang, Pei-Yi Gu, Yen-Ya Hsu, Chen-Han Tsai, Wei-Su Chen, Chen, F., Ming-Jinn Tsai, Chenhsin Lien
Published in IEEE electron device letters (01.11.2011)
Published in IEEE electron device letters (01.11.2011)
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Journal Article
Impact of compliance current overshoot on high resistance state, memory performance, and device yield of HfOx based resistive memory and its solution
Yu-Sheng Chen, Wen-Hsing Liu, Heng-Yuan Lee, Pang-Shiu Chen, Sum-Min Wang, Chen-Han Tsai, Yen-Ya Hsu, Pei-Yi Gu, Wei-Su Chen, Chen, Frederick, Chen-Hsin Lien, Ming-Jinn Tsai
Published in Proceedings of 2011 International Symposium on VLSI Technology, Systems and Applications (01.04.2011)
Published in Proceedings of 2011 International Symposium on VLSI Technology, Systems and Applications (01.04.2011)
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Conference Proceeding
Robust High-Resistance State and Improved Endurance of [Formula Omitted] Resistive Memory by Suppression of Current Overshoot
Chen, Yu-Sheng, Lee, Heng-Yuan, Chen, Pang-Shiu, Liu, Wen-Hsing, Wang, Sum-Min, Gu, Pei-Yi, Hsu, Yen-Ya, Tsai, Chen-Han, Chen, Wei-Su, Chen, Frederick, Tsai, Ming-Jinn, Lien, Chenhsin
Published in IEEE electron device letters (01.11.2011)
Published in IEEE electron device letters (01.11.2011)
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Journal Article
Robust High-Resistance State and Improved Endurance of hbox HfO X Resistive Memory by Suppression of Current Overshoot
Chen, Yu-Sheng, Lee, Heng-Yuan, Chen, Pang-Shiu, Liu, Wen-Hsing, Wang, Sum-Min, Gu, Pei-Yi, Hsu, Yen-Ya, Tsai, Chen-Han, Chen, Wei-Su, Chen, Frederick, Tsai, Ming-Jinn, Lien, Chenhsin
Published in IEEE electron device letters (01.11.2011)
Published in IEEE electron device letters (01.11.2011)
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Journal Article