IREM usage in the detection of highly resistive failures on 65nm products
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Published in 2005 IEEE International Integrated Reliability Workshop (2005)
Published in 2005 IEEE International Integrated Reliability Workshop (2005)
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Conference Proceeding
INTEGRATED CIRCUIT DEFECT DETECTION AND REPAIR
QUERBACH BRUCE, ZIMMERMAN DAVID J, HAMPSON CHRISTOPHER W, SCHOENBORN THEODORE Z, WAN IFAR, LUI WILLIAM K, ELLIS DAVID G, ZHANG YULAN, MALLELA RAMAKRISHNA
Year of Publication 04.07.2016
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Year of Publication 04.07.2016
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INTEGRATED CIRCUIT DEFECT DETECTION AND REPAIR
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Year of Publication 06.05.2020
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Year of Publication 06.05.2020
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Infrared Ray Emission (IREM) Based Post-Silicon Power Debug Flows Developed for Chip Power Performance
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Published in 2006 IEEE International Reliability Physics Symposium Proceedings (01.03.2006)
Published in 2006 IEEE International Reliability Physics Symposium Proceedings (01.03.2006)
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Conference Proceeding
2nd generation embedded DRAM with 4X lower self refresh power in 22nm Tri-Gate CMOS technology
Meterelliyoz, Mesut, Al-amoody, Fuad H., Arslan, Umut, Hamzaoglu, Fatih, Hood, Luke, Lal, Manoj, Miller, Jeffrey L., Ramasundar, Anand, Soltman, Dan, Wan Ifar, Yih Wang, Zhang, Kevin
Published in 2014 Symposium on VLSI Circuits Digest of Technical Papers (01.06.2014)
Published in 2014 Symposium on VLSI Circuits Digest of Technical Papers (01.06.2014)
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Conference Proceeding
Integrated circuit defect detection and repair
Querbach Bruce, Wan Ifar, Schoenborn Theodore Z, Lui William K, Ellis David G, Zhang Yulan, Hampson Christopher W, Zimmerman David J
Year of Publication 20.03.2018
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Year of Publication 20.03.2018
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INTEGRATED CIRCUIT DEFECT DETECTION AND REPAIR
WAN, Ifar, ZHANG, Yulan, HAMPSON, Christopher W, ZIMMERMAN, David J, ELLIS, David G, MALLELA, Ramakrishna, LUI, William K, SCHOENBORN, Theodore Z, QUERBACH, Bruce
Year of Publication 06.12.2017
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Year of Publication 06.12.2017
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INTEGRATED CIRCUIT DEFECT DETECTION AND REPAIR
LUI William K, ZHANG Yulan, SCHOENBORN Theodore Z, ELLIS David G, HAMPSON Christopher W, ZIMMERMAN David J, QUERBACH Bruce, WAN Ifar
Year of Publication 23.03.2017
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Year of Publication 23.03.2017
Patent
Integrated circuit defect detection and repair
Querbach Bruce, Wan Ifar, Mallela Ramakrishna, Schoenborn Theodore Z, Lui William K, Ellis David G, Zhang Yulan, Hampson Christopher W, Zimmerman David J
Year of Publication 07.02.2017
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Year of Publication 07.02.2017
Patent
Integrated circuit defect detection and repair
Querbach Bruce, Wan Ifar, Schoenborn Theodore Z, Lui William K, Ellis David G, Zhang Yulan, Hampson Christopher W, Zimmerman David J
Year of Publication 17.01.2017
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Year of Publication 17.01.2017
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INTEGRATED CIRCUIT DEFECT DETECTION AND REPAIR
ELLIS, DAVID G, LUI, WILLIAM K, WAN, IFAR, ZHANG, YULAN, QUERBACH, BRUCE, MALLELA, RAMAKRISHNA, SCHOENBORN, THEODORE Z, ZIMMERMAN, DAVID J, HAMPSON, CHRISTOPHER W
Year of Publication 02.11.2016
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Year of Publication 02.11.2016
Patent
INTEGRATED CIRCUIT DEFECT DETECTION AND REPAIR
ELLIS, DAVID G, LUI, WILLIAM K, WAN, IFAR, ZHANG, YULAN, QUERBACH, BRUCE, MALLELA, RAMAKRISHNA, SCHOENBORN, THEODORE Z, ZIMMERMAN, DAVID J, HAMPSON, CHRISTOPHER W
Year of Publication 02.07.2015
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Year of Publication 02.07.2015
Patent
INTEGRATED CIRCUIT DEFECT DETECTION AND REPAIR
QUERBACH BRUCE, ZIMMERMAN DAVID J, HAMPSON CHRISTOPHER W, SCHOENBORN THEODORE Z, WAN IFAR, LUI WILLIAM K, ELLIS DAVID G, ZHANG YULAN, MALLELA RAMAKRISHNA
Year of Publication 02.07.2015
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Year of Publication 02.07.2015
Patent
INTEGRATED CIRCUIT DEFECT DETECTION AND REPAIR
QUERBACH BRUCE, ZIMMERMAN DAVID J, HAMPSON CHRISTOPHER W, SCHOENBORN THEODORE Z, WAN IFAR, LUI WILLIAM K, ELLIS DAVID G, ZHANG YULAN
Year of Publication 02.07.2015
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Year of Publication 02.07.2015
Patent
Integrated circuit defect detection and repair
QUERBACH BRUCE, ZIMMERMAN DAVID J, HAMPSON CHRISTOPHER W, SCHOENBORN THEODORE Z, WAN IFAR, LUI WILLIAM K, ELLIS DAVID G, ZHANG YULAN, MALLELA RAMAKRISHNA
Year of Publication 06.07.2016
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Year of Publication 06.07.2016
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