Showing
1 - 2
results of
2
for search '
"WALDENMAIER, H. EUGEN"
'
Skip to content
Portal K.UTB
Čeština
Login
TBU Catalog
e-resources
E-THESES
All Fields
Title
Author
Subject
Find
Advanced Search
Search Results - "WALDENMAIER, H. EUGEN"
Showing
1 - 2
results of
2
for search '
"WALDENMAIER, H. EUGEN"
'
, query time: 0.52s
Refine Results
Sort
Relevance
Date Descending
Date Ascending
1
Loading…
OPTICAL THICKNESS PROFILER
by
DEGROOT, PETER J
,
HAYES, GUY H
,
WALDENMAIER
,
H
.
EUGEN
Year of Publication
26.05.1993
Get full text
Patent
Save to List
Saved in:
2
Loading…
Optical thickness profiler
by
DEGROOT, PETER J
,
HAYES, GUY H
,
WALDENMAIER
,
H
.
EUGEN
Year of Publication
30.09.1992
Get full text
Patent
Save to List
Saved in:
RSS Feed
Email Search
Save Search
Search History
Back
Refine Results
Page will reload when a filter is selected or excluded.
Limit to articles from scholarly journals
Limit to articles with full text available
Limit to Open Access content
Exclude newspaper articles
Include articles at other libraries
Expand results using synonyms
Format
Patent
2 results
2
Subject Area
chemistry
2 results
2
medicine
2 results
2
physics
2 results
2
sciences
2 results
2
Topic
arrangements for measuring two or more variables not coveredin a single other subclass
2 results
2
measuring
2 results
2
measuring angles
2 results
2
measuring areas
2 results
2
measuring irregularities of surfaces or contours
2 results
2
measuring length, thickness or similar lineardimensions
2 results
2
See more
Language
English
2 results
2
French
1 results
1
German
1 results
1
Year of Publication
From:
To:
Database
esp@cenet
2 results
2
