Change of TO and LO mode frequency of evaporated SiO2 films during aging in air
Brunet-Bruneau, A., Fisson, S., Vuye, G., Rivory, J.
Published in Journal of applied physics (15.05.2000)
Published in Journal of applied physics (15.05.2000)
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Journal Article
Near infrared absorption of Si nanoparticles embedded in silica films
Stenger, I., Siozade, L., Gallas, B., Fisson, S., Vuye, G., Rivory, J.
Published in Surface science (15.07.2007)
Published in Surface science (15.07.2007)
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Journal Article
Dielectric function of Si nanocrystals embedded in SiO2
Gallas, B., Kao, Chih-Cheng, Defranoux, C., Fisson, S., Vuye, G., Rivory, J.
Published in Thin solid films (01.05.2004)
Published in Thin solid films (01.05.2004)
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Journal Article
Laser annealing of SiO x thin films
Gallas, B, Kao, C.-C, Fisson, S, Vuye, G, Rivory, J, Bernard, Y, Belouet, C
Published in Applied surface science (15.01.2002)
Published in Applied surface science (15.01.2002)
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Journal Article
Correlation between Si-related and erbium photoluminescence bands and determination of erbium effective excitation cross section in SiO2 films
Kao, C.-C., Barthou, C., Gallas, B., Fisson, S., Vuye, G., Rivory, J., Al Choueiry, A., Jurdyc, A.-M., Jacquier, B., Bigot, L.
Published in Journal of applied physics (01.07.2005)
Published in Journal of applied physics (01.07.2005)
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Journal Article
Relations between the optical properties and the microstructure of TiO2 thin films prepared by ion-assisted deposition
LEPRINCE-WANG, Y, SOUCHE, D, YU-ZHANG, K, FISSON, S, VUYE, G, RIVORY, J
Published in Thin solid films (31.01.2000)
Published in Thin solid films (31.01.2000)
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Journal Article
Study of the interface Si-nc/SiO2 by infrared spectroscopic ellipsometry and X-ray photoelectron spectroscopy
STENGER, I, GALLAS, B, SIOZADE, L, FISSON, S, VUYE, G, CHENOT, S, RIVORY, J
Published in Physica. E, Low-dimensional systems & nanostructures (01.04.2007)
Published in Physica. E, Low-dimensional systems & nanostructures (01.04.2007)
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Conference Proceeding
Journal Article
Temperature dependence of the dielectric function of silicon using in situ spectroscopic ellipsometry
Vuye, G., Fisson, S., Nguyen Van, V., Wang, Y., Rivory, J., Abelès, F.
Published in Thin solid films (12.10.1993)
Published in Thin solid films (12.10.1993)
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Journal Article
Conference Proceeding
Infrared ellipsometric study of SiO2 films: relationship between LO mode frequency and porosity
Brunet-Bruneau, A, Fisson, S, Gallas, B, Vuye, G, Rivory, J
Published in Thin solid films (01.12.2000)
Published in Thin solid films (01.12.2000)
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Journal Article
In situ control of SiOx composition by spectroscopic ellipsometry
Gallas, B, Kao, C.-C, Fisson, S, Vuye, G, Rivory, J
Published in Materials science & engineering. B, Solid-state materials for advanced technology (15.12.2003)
Published in Materials science & engineering. B, Solid-state materials for advanced technology (15.12.2003)
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Journal Article
Initial stages in the formation of PtSi on Si(111) as followed by photoemission and spectroscopic ellipsometry
Ley, L., Wang, Y., Van, V.Nguyen, Fisson, S., Souche, D., Vuye, G., Rivory, J.
Published in Thin solid films (01.12.1995)
Published in Thin solid films (01.12.1995)
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Journal Article
Conference Proceeding
Ellipsometric investigation of the Si/SiO2 interface formation for application to highly reflective dielectric mirrors
Gallas, B, Fisson, S, Brunet-Bruneau, A, Vuye, G, Rivory, J
Published in Thin solid films (01.12.2000)
Published in Thin solid films (01.12.2000)
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Journal Article
Visible and infrared ellipsometry study of ion assisted SiO2 films
Souche, D., Brunet-Bruneau, A., Fisson, S., Nguyen Van, V., Vuye, G., Abeles, F., Rivory, J.
Published in Thin solid films (01.02.1998)
Published in Thin solid films (01.02.1998)
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Journal Article
Determination of refractive-index profiles by a combination of visible and infrared ellipsometry measurements
Nguyen Van, V, Brunet-Bruneau, A, Fisson, S, Frigerio, J M, Vuye, G, Wang, Y, Abelνs, F, Rivory, J, Berger, M, Chaton, P
Published in Applied optics (2004) (01.10.1996)
Published in Applied optics (2004) (01.10.1996)
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Journal Article
Growth of low and high refractive index dielectric layers as studied by in situ ellipsometry
NGUYEN VAN, V, FISSON, S, FRIGERIO, J. M, RIVORY, J, VUYE, G, WANG, Y, ABELES, F
Published in Thin solid films (15.12.1994)
Published in Thin solid films (15.12.1994)
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Conference Proceeding
Journal Article
Study of CaF2 growth on Si, a-Si O2 by in-situ spectroscopic ellipsometry
Rivory, J., Fisson, S., Nguyen Van, V., Vuye, G., Wang, Y., Abelés, F., Yu-Zhang, K.
Published in Thin solid films (01.10.1993)
Published in Thin solid films (01.10.1993)
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Journal Article
X-ray photoelectron spectroscopy study of the growth of dielectric films on various substrates
Wang, Y., Fisson, S., Van, V. Nguyen, Vuye, G., Yu-Zhang, K., Rivory, J.
Published in Surface & coatings technology (01.12.1994)
Published in Surface & coatings technology (01.12.1994)
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Journal Article
Conference Proceeding
Evolution of the optical properties of Si nanoparticles embedded in SiO2 as function of annealing conditions
Stenger, I., Gallas, B., Siozade, L., Kao, C.-C., Chenot, S., Fisson, S., Vuye, G., Rivory, J.
Published in Journal of applied physics (01.06.2008)
Published in Journal of applied physics (01.06.2008)
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Journal Article