On-Chip Antennas for IC Reliability and Aging Monitoring
Muha, Andrew, Vutukuru, Manoj Yasaswi, Gogi, Vamshi Kiran, Jha, Rashmi
Published in 2024 IEEE 67th International Midwest Symposium on Circuits and Systems (MWSCAS) (11.08.2024)
Published in 2024 IEEE 67th International Midwest Symposium on Circuits and Systems (MWSCAS) (11.08.2024)
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Conference Proceeding
On-Chip EM Sensor Arrays for Reliability Monitoring of Integrated Circuits
Vutukuru, Manoj Yasaswi, Muha, Andrew, Jha, Rashmi
Published in NAECON 2023 - IEEE National Aerospace and Electronics Conference (28.08.2023)
Published in NAECON 2023 - IEEE National Aerospace and Electronics Conference (28.08.2023)
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Conference Proceeding
Impact of CMOS BEOL and Heterogenous Packaging Process Conditions on the Performance of On-Chip Antenna Arrays for EM Radiation Monitoring
Vutukuru, Manoj Yasaswi, Muha, Andrew, Srinivasan, Ramesh, Jha, Rashmi
Published in NAECON 2024 - IEEE National Aerospace and Electronics Conference (15.07.2024)
Published in NAECON 2024 - IEEE National Aerospace and Electronics Conference (15.07.2024)
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Conference Proceeding
IC SynthLogo: A Synthetic Logo Image Dataset for Counterfeit and Recycled IC detection
Mallaiyan Sathiaseelan, Mukhil Azhagan, Vutukuru, Manoj Yasaswi, Pandurangi, Suryaprakash Vasudev, Taheri, Shayan, Asadizanjani, Navid
Published in 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (15.09.2021)
Published in 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (15.09.2021)
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Conference Proceeding
Logo Detection and Localization for IC Authentication, Marking Recognition, and Counterfeit Detection
Sathiaseelan, Mukhil Azhagan Mallaiyan, Vutukuru, Manoj Yasaswi, Ghosh, Shajib, Paradis, Olivia P., Tehranipoor, Mark, Asadizanjani, Navid, Crandall, David
Published in 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (18.07.2022)
Published in 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (18.07.2022)
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Conference Proceeding