Single Event Effects and TID Characterization of the Frontgrade Technologies UT24C407 Certus™-NX-RT FPGA for Space Applications
Von Thun, Matt, Baranski, Brian, Turnbull, Aaron, Berg, Melanie, Linton, Scott
Published in 2023 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2023 NSREC) (01.07.2023)
Published in 2023 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2023 NSREC) (01.07.2023)
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Conference Proceeding
SEU and SEFI Characterization of a Frontgrade QCOTS 512Gb NAND Flash Nonvolatile Memory for Space Applications
Nelson, Peter, Von Thun, Matt, Turnbull, Aaron, Baranski, Brian, Meade, Tim
Published in 2023 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2023 NSREC) (01.07.2023)
Published in 2023 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2023 NSREC) (01.07.2023)
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Conference Proceeding
SEU, SET, and SEFI Test Results of a Hardened 16Mbit MRAM Device
Hafer, C., Von Thun, M., Mundie, M., Bass, D., Sievert, F.
Published in 2012 IEEE Radiation Effects Data Workshop (01.07.2012)
Published in 2012 IEEE Radiation Effects Data Workshop (01.07.2012)
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Conference Proceeding
Single event upset investigations on the “Flying Laptop” satellite mission
Noeldeke, Christoph, Boettcher, Maximilian, Mohr, Ulrich, Gaisser, Steffen, Alvarez Rua, Mikel, Eickhoff, Jens, Leslie, Mike, Von Thun, Matt, Klinkner, Sabine, Varatharajoo, Renuganth
Published in Advances in space research (15.03.2021)
Published in Advances in space research (15.03.2021)
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Journal Article
Single Event Latch-up and Total Ionizing Dose Characterization of a Cobham Designed Smart Power Switch Controller
Von Thun, Matt, Lotfi, Younes, Meade, Tim, Turnbull, Aaron
Published in 2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) (01.11.2020)
Published in 2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) (01.11.2020)
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Conference Proceeding
SEL and TID Characterization of a Cobham Advanced Electronic Solutions SONOS Nonvolatile Memory
Von Thun, Matt, Bass, Derek, Dumitru, Radu, Anderson, Rex, Benthem, Jack, Ashenafi, Shaw
Published in 2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) (01.11.2020)
Published in 2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) (01.11.2020)
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Conference Proceeding
Radiation Effects Characterization of an Arm®-Based 32-bit Microcontroller
Wilson, Anthony, Von Thun, Matt, Baranski, Brian, Anderson, Rex, Turnbull, Aaron
Published in 2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018) (01.07.2018)
Published in 2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018) (01.07.2018)
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Conference Proceeding
SEU Characterization of an Embedded 130nm Compiled SRAM in Heavy Ion and Proton Environments
Von Thun, Matt, Walz, Dale, Dumitru, Radu, Wilson, Anthony, Farris, Teresa
Published in 2017 IEEE Radiation Effects Data Workshop (REDW) (01.07.2017)
Published in 2017 IEEE Radiation Effects Data Workshop (REDW) (01.07.2017)
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Conference Proceeding
Heavy Ion and TID Characterization of 3.3 V Voltage Supervisors
Wilson, Anthony L., Walz, Dale, Lotfi, Younes, Merkel, Ken, Von Thun, Matt, Farris, Teresa
Published in 2017 IEEE Radiation Effects Data Workshop (REDW) (01.07.2017)
Published in 2017 IEEE Radiation Effects Data Workshop (REDW) (01.07.2017)
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Conference Proceeding
Single Event Transient and Single Event Upset Characterization of a Cobham Designed 3.125 Gbps Crosspoint Switch
Thun, Matt Von, Engelbart, Ted, Pfeil, John, Turnbull, Aaron
Published in 2019 IEEE Radiation Effects Data Workshop (01.07.2019)
Published in 2019 IEEE Radiation Effects Data Workshop (01.07.2019)
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Conference Proceeding
SEL and TID Test Results on a Radiation Hardened Bus Switch Family
Von Thun, Matt, Sapp, Scott, Walz, Dale, Anderson, Rex, Farris, Teresa
Published in 2016 IEEE Radiation Effects Data Workshop (REDW) (2016)
Published in 2016 IEEE Radiation Effects Data Workshop (REDW) (2016)
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Conference Proceeding
SEL and TID Test Results of a Hardened CAN Transceiver
Von Thun, Matt, Bass, Derek, Walz, Dale, Anderson, Rex, Farris, Teresa
Published in 2016 IEEE Radiation Effects Data Workshop (REDW) (2016)
Published in 2016 IEEE Radiation Effects Data Workshop (REDW) (2016)
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Conference Proceeding