Computational Simulation of a Field-Induced Charged Board Event Test Bench Using Transient Analysis
Chumpen, S., Pimpakun, S., Plong-ngooluam, S., Voldman, S.H., Sa-ngiamsak, C.
Published in IEEE access (01.01.2023)
Published in IEEE access (01.01.2023)
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Journal Article
Electrostatic Discharge (ESD) and latchup in advanced semiconductors
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Conference Proceeding
The effects of gate field on the leakage characteristics of heavily doped junctions
Noble, W.P., Voldman, S.H., Bryant, A.
Published in IEEE transactions on electron devices (01.04.1989)
Published in IEEE transactions on electron devices (01.04.1989)
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Journal Article
Latchup and the domino effect
Voldman, S.H.
Published in 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual (2005)
Published in 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual (2005)
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Conference Proceeding
The impact of technology evolution and scaling on electrostatic discharge (ESD) protection in high-pin count high-performance microprocessors
Voldman, S.H.
Published in 1999 IEEE International Solid-State Circuits Conference. Digest of Technical Papers. ISSCC. First Edition (Cat. No.99CH36278) (1999)
Published in 1999 IEEE International Solid-State Circuits Conference. Digest of Technical Papers. ISSCC. First Edition (Cat. No.99CH36278) (1999)
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Conference Proceeding
ESD failure mechanisms of inductive and magnetoresistive recording heads
Wallash, A.J., Hughbanks, T.S., Voldman, S.H.
Published in Electrical Overstress/Electrostatic Discharge Symposium Proceedings (1995)
Published in Electrical Overstress/Electrostatic Discharge Symposium Proceedings (1995)
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Conference Proceeding
Journal Article
The effect of deep trench isolation, trench isolation and sub-collector doping on the electrostatic discharge (ESD) robustness of radio frequency (RF) ESD STI-bound P+/N-well diodes in BiCMOS silicon germanium technology
Voldman, S.H.
Published in 2003 Electrical Overstress/Electrostatic Discharge Symposium (01.09.2003)
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Published in 2003 Electrical Overstress/Electrostatic Discharge Symposium (01.09.2003)
Conference Proceeding
Electrically Programmable Fuses for Analog and Mixed Signal Applications in Silicon Germanium BiCMOS Technologies
Gebreselasie, E.G., Voldman, S.H., He, Z. X., Coolbaugh, D., Rassel, R.M., Kirihata, T., Paganini, A., Cox, C.G., Mongeon, S.A., St. Onge, S.A., Dunn, J.S., Halbach, R.E., Lukaitis, J.M.
Published in 2007 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (01.09.2007)
Published in 2007 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (01.09.2007)
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Conference Proceeding
The influence of implanted sub-collector on CMOS latchup robustness
Voldman, S.H., Gebreselasie, E.G.
Published in 2005 Electrical Overstress/Electrostatic Discharge Symposium (01.09.2005)
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Published in 2005 Electrical Overstress/Electrostatic Discharge Symposium (01.09.2005)
Conference Proceeding