TCAD Study of VLD Termination in Large-Area Power Devices Featuring a DLC Passivation
Balestra, L., Reggiani, S., Gnudi, A., Gnani, E., Dobrzynska, J., Vobecky, J.
Published in IEEE transactions on electron devices (01.11.2020)
Published in IEEE transactions on electron devices (01.11.2020)
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Journal Article
Influence of the DLC Passivation Conductivity on the Performance of Silicon High-Power Diodes Over an Extended Temperature Range
Balestra, L., Reggiani, S., Gnudi, A., Gnani, E., Dobrzynska, J., Vobecky, J.
Published in IEEE journal of the Electron Devices Society (2021)
Published in IEEE journal of the Electron Devices Society (2021)
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Journal Article
Optimal Gate Commutated Thyristor Design for Bi-Mode Gate Commutated Thyristors Underpinning High, Temperature Independent, Current Controllability
Lophitis, N., Antoniou, M., Vemulapati, U., Vobecky, J., Badstuebner, U., Wikstroem, T., Stiasny, T., Rahimo, M., Udrea, F.
Published in IEEE electron device letters (01.09.2018)
Published in IEEE electron device letters (01.09.2018)
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Journal Article
Thin-Wafer Silicon IGBT With Advanced Laser Annealing and Sintering Process
Rahimo, M., Corvasce, C., Vobecky, J., Otani, Y., Huet, K.
Published in IEEE electron device letters (01.11.2012)
Published in IEEE electron device letters (01.11.2012)
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Journal Article
New Bi-Mode Gate-Commutated Thyristor Design Concept for High-Current Controllability and Low ON-State Voltage Drop
Lophitis, N., Antoniou, M., Vemulapati, U., Arnold, M., Nistor, I., Vobecky, J., Rahimo, M., Udrea, F.
Published in IEEE electron device letters (01.04.2016)
Published in IEEE electron device letters (01.04.2016)
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Journal Article
Molybdenum and low-temperature annealing of a silicon power P–i–N diode
Vobecký, J., Komarnitskyy, V., Záhlava, V.
Published in Microelectronics and reliability (01.03.2011)
Published in Microelectronics and reliability (01.03.2011)
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Journal Article
Left Atrial Inexcitability in Children With Congenital Lupus-Induced Complete Atrioventricular Block
Abadir, Sylvia, Fournier, Anne, Vobecky, Suzanne J, Rohlicek, Charles V, Romeo, Philippe, Khairy, Paul
Published in Journal of the American Heart Association (01.12.2015)
Published in Journal of the American Heart Association (01.12.2015)
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Journal Article
Treatment of Isolated Ventricular Septal Defects in Children: Amplatzer Versus Surgical Closure
Oses, Pierre, MD, Hugues, Nicolas, MD, Dahdah, Nagib, MD, Vobecky, Suzanne J., MD, Miro, Joaquim, MD, Pellerin, Michel, MD, Poirier, Nancy C., MD
Published in The Annals of thoracic surgery (01.11.2010)
Published in The Annals of thoracic surgery (01.11.2010)
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Journal Article
The Bi-mode Insulated Gate Transistor (BIGT) a potential technology for higher power applications
Rahimo, M., Kopta, A., Schlapbach, U., Vobecky, J., Schnell, R., Klaka, S.
Published in 2009 21st International Symposium on Power Semiconductor Devices & IC's (01.06.2009)
Published in 2009 21st International Symposium on Power Semiconductor Devices & IC's (01.06.2009)
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Conference Proceeding
Cardiac resynchronization therapy in congenital heart disease
Khairy, Paul, Fournier, Anne, Thibault, Bernard, Dubuc, Marc, Thérien, Johanne, Vobecky, Suzanne J.
Published in International journal of cardiology (10.05.2006)
Published in International journal of cardiology (10.05.2006)
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Journal Article
CD5 levels define functionally heterogeneous populations of naïve human CD4+ T cells
Sood, Aditi, Lebel, Marie‐Ève, Dong, Mengqi, Fournier, Marilaine, Vobecky, Suzanne J., Haddad, Élie, Delisle, Jean‐Sébastien, Mandl, Judith N., Vrisekoop, Nienke, Melichar, Heather J.
Published in European journal of immunology (01.06.2021)
Published in European journal of immunology (01.06.2021)
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Journal Article
Recent Progress in Silicon Devices for Ultra-High Power Applications
Vobecky, J., Vemulapati, U., Wikstrom, T., Boksteen, B., Dugal, F., Stiasny, T., Corvasce, C.
Published in 2021 IEEE International Electron Devices Meeting (IEDM) (11.12.2021)
Published in 2021 IEEE International Electron Devices Meeting (IEDM) (11.12.2021)
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Conference Proceeding
TCAD study of DLC coatings for large-area high-power diodes
Reggiani, S., Balestra, L., Gnudi, A., Gnani, E., Baccarani, G., Dobrzynska, J., Vobecký, J., Tosi, C.
Published in Microelectronics and reliability (01.09.2018)
Published in Microelectronics and reliability (01.09.2018)
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Journal Article