by Rice, Stephen B, Chan, Christopher, Brown, Scott C, Eschbach, Peter, Han, Li, Ensor, David S, Stefaniak, Aleksandr B, Bonevich, John, Vladár, András E, Walker, Angela R Hight, Zheng, Jiwen, Starnes, Catherine, Stromberg, Arnold, Ye, Jia, Grulke, Eric A
Published in Metrologia (01.12.2013)

by Postek, Michael T, Vladár, András E
Published in Proceedings of SPIE, the international society for optical engineering (01.01.2015)

by Postek, Michael T., Poster, Dianne L., Vládar, András E., Driscoll, Mark S., LaVerne, Jay A., Tsinas, Zois, Al-Sheikhly, Mohamad I.
Published in Radiation physics and chemistry (Oxford, England : 1993) (01.02.2018)

by Postek, Michael T., Vladár, András E.
Published in Scanning (01.11.2013)

by Postek, Michael T., Vladár, András E., Purushotham, Kavuri P.
Published in Scanning (01.05.2014)

by Zhao, Minhua, Ming, Bin, Kim, Jae-Woo, Gibbons, Luke J, Gu, Xiaohong, Nguyen, Tinh, Park, Cheol, Lillehei, Peter T, Villarrubia, J S, Vladár, András E, Alexander Liddle, J
Published in Nanotechnology (27.02.2015)

by Barnes, Bryan M, Sohn, Martin Y, Goasmat, Francois, Zhou, Hui, Vladár, András E, Silver, Richard M, Arceo, Abraham
Published in Optics express (04.11.2013)

by Postek, Michael T., Vladár, András E., Villarrubia, John S., Muto, Atsushi
Published in Microscopy and microanalysis (01.08.2016)

by Tondare, Vipin N., Villarrubia, John S., Vladár, András E.
Published in Microscopy and microanalysis (01.10.2017)

by Postek, Michael T., Vladár, András E.
Published in Scanning (01.05.2011)

by Carasso, Alfred S, Vladár, András E
Published in Journal of research of the National Institute of Standards and Technology (2014)

by Cizmar, Petr, Vladár, András E., Postek, Michael T.
Published in Microscopy and microanalysis (01.04.2011)

by Postek, Michael T., Vladár, Andras E.
Published in Scanning (01.11.2008)

by Carasso, Alfred S, Vladár, András E
Published in Journal of research of the National Institute of Standards and Technology (2012)

by Attota, Ravi Kiran, Kang, Hyeonggon, Scott, Keana, Allen, Richard, Vladar, Andras E, Bunday, Benjamin
Published in Measurement science & technology (01.12.2018)

by Guo, Hongxuan, Yulaev, Alexander, Strelcov, Evgheni, Tselev, Alexander, Arble, Christopher, Vladar, Andras E, Villarrubia, John S, Kolmakov, Andrei
Published in ACS applied materials & interfaces (16.12.2020)

by Poster, Dianne L, Hardwick, Matthew, Miller, C Cameron, Riley, Michael A, Rodrigo, W W Shanaka I, Vladar, Andras E, Wright, John D, Zangmeister, Christopher D, Zarobila, Clarence, Starkweather, Jeremy, Wynne, John, Yilzarde, Jason
Published in Journal of research of the National Institute of Standards and Technology (2021)

by Postek, Michael T., Villarrubia, John, Vladar, Andras E., Muto, Atsushi
Published in Microscopy and microanalysis (01.08.2015)

by Vladár, AndráS E., Radi, Zsolt, Postek, Michael T., Joy, David C.
Published in Scanning (01.05.2006)

by Postek, Michael T., Vladar, Andras E., Ming, Bin
Published in Microscopy and microanalysis (01.08.2014)