Focused Ion Beam Sample Preparation of Complex Devices
Russell, P E, Bunker, K L, Garcia, R, Stark, T J, Vitarelli, J P
Published in Microscopy and microanalysis (01.08.2005)
Published in Microscopy and microanalysis (01.08.2005)
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Journal Article
Focused Ion Beam: Much More Than a Sample Preparation Tool
Russell, P.E., Stark, T.J., Viterelli, J.P., Guichard, A.R., Wang, J., Bunker, K. L., Gonzalez, J.C., Griffis, D.P.
Published in Microscopy and microanalysis (01.08.2002)
Published in Microscopy and microanalysis (01.08.2002)
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Journal Article