A full-range dual material gate tunnel field effect transistor drain current model considering both source and drain depletion region band-to-band tunneling
Pandey, Pratyush, Vishnoi, Rajat, Kumar, M. Jagadesh
Published in Journal of computational electronics (01.03.2015)
Published in Journal of computational electronics (01.03.2015)
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Journal Article
DC Drain Current Model for Tunnel FETs Considering Source and Drain Depletion Regions
Vishnoi, Rajat, Panday, Pratyush, Kumar, M. Jagadesh
Published in 2017 30th International Conference on VLSI Design and 2017 16th International Conference on Embedded Systems (VLSID) (01.01.2017)
Published in 2017 30th International Conference on VLSI Design and 2017 16th International Conference on Embedded Systems (VLSID) (01.01.2017)
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Conference Proceeding
First Time Enablement of RF Reliability Simulation Using Cadence Relxpert
Vishnoi, Rajat, Satish, Naga, Rauch, Stewart, Guarin, Fernando
Published in 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) (01.04.2020)
Published in 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) (01.04.2020)
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Conference Proceeding
Numerical study of the threshold voltage of TFETs with localized charges
Vishnoi, Rajat, Kumar, M. Jagadesh
Published in 2014 IEEE 2nd International Conference on Emerging Electronics (ICEE) (01.12.2014)
Published in 2014 IEEE 2nd International Conference on Emerging Electronics (ICEE) (01.12.2014)
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Conference Proceeding
Drain current model for SOI TFET considering source and drain side tunneling
Pandey, Pratyush, Vishnoi, Rajat, Kumar, M. Jagadesh
Published in 2014 IEEE 2nd International Conference on Emerging Electronics (ICEE) (01.12.2014)
Published in 2014 IEEE 2nd International Conference on Emerging Electronics (ICEE) (01.12.2014)
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Conference Proceeding
A novel back gated GaN/AlGaN HEMT structure for biological sensing applications
Kejriwal, Shruti, Vishnoi, Rajat, Dhawan, Anuj
Published in 2014 IEEE 2nd International Conference on Emerging Electronics (ICEE) (01.12.2014)
Published in 2014 IEEE 2nd International Conference on Emerging Electronics (ICEE) (01.12.2014)
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Conference Proceeding
A Compact Analytical Model for the drain current of a TFET with non-abrupt doping profile incorporating the effect of band-gap narrowing
Vishnoi, Rajat, Kumar, M. Jagadesh
Published in 2015 IEEE 15th International Conference on Nanotechnology (IEEE-NANO) (01.07.2015)
Published in 2015 IEEE 15th International Conference on Nanotechnology (IEEE-NANO) (01.07.2015)
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Conference Proceeding