Showing
1 - 20
results of
43
for search '
"Vishal, Vaibhaw"
'
Skip to content
Portal K.UTB
Čeština
Login
TBU Catalog
e-resources
E-THESES
All Fields
Title
Author
Subject
Find
Advanced Search
Search Results - "Vishal, Vaibhaw"
Showing
1 - 20
results of
43
for search '
"Vishal, Vaibhaw"
'
, query time: 0.83s
Refine Results
Sort
Relevance
Date Descending
Date Ascending
1
Loading…
플로팅 웨이퍼 척
by
BALAN AVIV
,
VISHAL VAIBHAW
Year of Publication
23.12.2019
Get full text
Patent
Save to List
Saved in:
2
Loading…
고온 처리 응용에서 측정 파라미터를 획득하기 위한 계장화 기판 장치
by
SUN MEI
,
VISHAL VAIBHAW
Year of Publication
12.09.2018
Get full text
Patent
Save to List
Saved in:
3
Loading…
Role of Computed Tomography Guided Fine-Needle Aspiration Cytology in the Study of Various Thoracic Mass Lesions
by
Kumari, Nawanita
,
Kumar, Nidhish
,
Singh, Sharvani
,
Vaibhaw
,
Vishal
Published in
Journal of evolution of medical and dental sciences
(03.05.2021)
Get full text
Journal Article
Save to List
Saved in:
4
Loading…
HEAT SHIELD MODULE FOR SUBSTRATE-LIKE METROLOGY DEVICE
by
SUN MEI
,
VISHAL VAIBHAW
Year of Publication
12.03.2014
Get full text
Patent
Save to List
Saved in:
5
Loading…
COMPARATIVE STUDY OF DEXMEDETOMIDINE AND MAGNESIUM SULPHATE AS AN ADJUVANT TO BUPIVACAINE IN SPINAL ANESTHESIA
by
Singh, Rakesh Kumar
,
Vaibhaw
,
Vishal
,
Hasnat, Sabir
Published in
Journal of evidence based medicine and healthcare
(29.08.2015)
Get full text
Journal Article
Save to List
Saved in:
6
Loading…
METHODS OF ATTACHING A MODULE ON WAFER SUBSTRATE
by
HEARN KRIS
,
SUN MEI
,
VISHAL VAIBHAW
,
NGUYEN ANDREW
Year of Publication
01.10.2015
Get full text
Patent
Save to List
Saved in:
7
Loading…
PROCESS CONDITION MEASURING DEVICE (PCMD) AND METHOD FOR MEASURING PROCESS CONDITIONS IN A WORKPIECE PROCESSING TOOL CONFIGURED TO PROCESS PRODUCTION WORKPIECES
by
SUN MEI
,
ARLEO PAUL
,
JENSEN EARL
,
VISHAL VAIBHAW
,
QULI FARHAT
Year of Publication
10.01.2014
Get full text
Patent
Save to List
Saved in:
8
Loading…
Instrumented substrate apparatus for acquiring measurement parameters in high temperature process applications
by
Vishal
,
Vaibhaw
,
Sun, Mei
Year of Publication
19.10.2021
Get full text
Patent
Save to List
Saved in:
9
Loading…
INSTRUMENTED SUBSTRATE APPARATUS FOR ACQUIRING MEASUREMENT PARAMETERS IN HIGH TEMPERATURE PROCESS APPLICATIONS
by
VISHAL
,
Vaibhaw
,
SUN, Mei
Year of Publication
29.09.2020
Get full text
Patent
Save to List
Saved in:
10
Loading…
INSTRUMENTED SUBSTRATE APPARATUS FOR ACQUIRING MEASUREMENT PARAMETERS IN HIGH TEMPERATURE PROCESS APPLICATIONS
by
VISHAL
,
Vaibhaw
,
SUN, Mei
Year of Publication
30.03.2020
Get full text
Patent
Save to List
Saved in:
11
Loading…
FLOATING WAFER CHUCK
by
BALAN, Aviv
,
VISHAL
,
Vaibhaw
Year of Publication
15.11.2018
Get full text
Patent
Save to List
Saved in:
12
Loading…
Floating wafer chuck
by
Vishal
,
Vaibhaw
,
Balan, Aviv
Year of Publication
25.09.2018
Get full text
Patent
Save to List
Saved in:
13
Loading…
INSTRUMENTED SUBSTRATE APPARATUS FOR ACQUIRING MEASUREMENT PARAMETERS IN HIGH TEMPERATURE PROCESS APPLICATIONS
by
VISHAL
,
Vaibhaw
,
SUN, Mei
Year of Publication
30.08.2018
Get full text
Patent
Save to List
Saved in:
14
Loading…
INSTRUMENTED SUBSTRATE APPARATUS FOR ACQUIRING MEASUREMENT PARAMETERS IN HIGH TEMPERATURE PROCESS APPLICATIONS
by
VISHAL
,
Vaibhaw
,
SUN, Mei
Year of Publication
10.08.2017
Get full text
Patent
Save to List
Saved in:
15
Loading…
Instrumented Substrate Apparatus for Acquiring Measurement Parameters in High Temperature Process Applications
by
Sun Mei
,
Vishal Vaibhaw
Year of Publication
03.08.2017
Get full text
Patent
Save to List
Saved in:
16
Loading…
Instrumented substrate apparatus for acquiring measurement parameters in high temperature process applications
by
VISHAL
,
VAIBHAW
,
SUN, MEI
Year of Publication
01.07.2021
Get full text
Patent
Save to List
Saved in:
17
Loading…
HEAT SHIELD MODULE FOR SUBSTRATE-LIKE METROLOGY DEVICE
by
VISHAL
,
VAIBHAW
,
SUN, MEI
Year of Publication
12.08.2015
Get full text
Patent
Save to List
Saved in:
18
Loading…
PROCESS CONDITION MEASURING DEVICE (PCMD) AND METHOD FOR MEASURING PROCESS CONDITIONS IN A WORKPI ECE PROCESSING TOOL CONFIGURED TO PROCESS PRODUCTION WORKPIECES
by
JENSEN, Earl
,
ARLEO, Paul
,
QULI, Farhat
,
VISHAL
,
Vaibhaw
,
SUN, Mei
Year of Publication
04.03.2020
Get full text
Patent
Save to List
Saved in:
19
Loading…
FLOATING WAFER CHUCK
by
BALAN AVIV
,
VISHAL VAIBHAW
Year of Publication
24.12.2019
Get full text
Patent
Save to List
Saved in:
20
Loading…
Heat shield module for substrate-like metrology device
by
SUN MEI
,
VISHAL VAIBHAW
Year of Publication
25.03.2014
Get full text
Patent
Save to List
Saved in:
1
2
3
Next
[3]
RSS Feed
Email Search
Save Search
Search History
Back
Refine Results
Page will reload when a filter is selected or excluded.
Limit to articles from scholarly journals
Limit to articles with full text available
Limit to Open Access content
Exclude newspaper articles
Include articles at other libraries
Expand results using synonyms
Format
Patent
41 results
41
Journal Article
2 results
2
Subject Area
medicine
43 results
43
chemistry
41 results
41
sciences
41 results
41
physics
14 results
14
Topic
basic electric elements
37 results
37
electric solid state devices not otherwise provided for
37 results
37
electricity
37 results
37
semiconductor devices
37 results
37
general tagging of cross-sectional technologies spanning over several sections of the ipc
14 results
14
general tagging of new technological developments
14 results
14
See more
Language
English
41 results
41
Chinese
12 results
12
French
11 results
11
German
5 results
5
Korean
5 results
5
Year of Publication
From:
To:
Database
esp@cenet
41 results
41
Open Access Digital Library
2 results
2
DOAJ Directory of Open Access Journals
1 results
1
ROAD: Directory of Open Access Scholarly Resources
1 results
1
