Comparison of three topologies and controls of a hybrid energy storage system for microgrids
Etxeberria, A., Vechiu, I., Camblong, H., Vinassa, J.-M.
Published in Energy conversion and management (01.02.2012)
Published in Energy conversion and management (01.02.2012)
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Journal Article
Investigation of critical parameters in power supplies components failure due to electric pulse
Curos, L., Dubois, T., Mejecaze, G., Puybaret, F., Plano, B., Vinassa, J.-M.
Published in Microelectronics and reliability (01.11.2020)
Published in Microelectronics and reliability (01.11.2020)
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Journal Article
Impact of temperature on calendar ageing of Lithium-ion battery using incremental capacity analysis
Maures, M., Zhang, Y., Martin, C., Delétage, J.-Y., Vinassa, J.-M., Briat, O.
Published in Microelectronics and reliability (01.09.2019)
Published in Microelectronics and reliability (01.09.2019)
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Journal Article
Destruction analyses of power supplies due to electric pulse
Mejecaze, G., Dubois, T., Curos, L., Puybaret, F., Vinassa, J.-M.
Published in Microelectronics and reliability (01.09.2019)
Published in Microelectronics and reliability (01.09.2019)
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Journal Article
Characterization methods and modelling of ultracapacitors for use as peak power sources
Lajnef, W., Vinassa, J.-M., Briat, O., Azzopardi, S., Woirgard, E.
Published in Journal of power sources (01.06.2007)
Published in Journal of power sources (01.06.2007)
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Journal Article
Impact of Calendar Life and Cycling Ageing on Supercapacitor Performance
El Brouji, E.-H., Briat, O., Vinassa, J.-M., Bertrand, N., Woirgard, E.
Published in IEEE transactions on vehicular technology (01.10.2009)
Published in IEEE transactions on vehicular technology (01.10.2009)
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Journal Article
Ageing monitoring of lithium-ion cell during power cycling tests
Eddahech, A., Briat, O., Henry, H., Delétage, J.-Y., Woirgard, E., Vinassa, J.-M.
Published in Microelectronics and reliability (01.09.2011)
Published in Microelectronics and reliability (01.09.2011)
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Journal Article
Conference Proceeding
Prediction of supercapacitors floating ageing with surface electrode interface based ageing law
German, R., Sari, A., Venet, P., Ayadi, M., Briat, O., Vinassa, J.M.
Published in Microelectronics and reliability (01.09.2014)
Published in Microelectronics and reliability (01.09.2014)
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Journal Article
Conference Proceeding
Study on specific effects of high frequency ripple currents and temperature on supercapacitors ageing
German, R., Sari, A., Venet, P., Briat, O., Vinassa, J.-M.
Published in Microelectronics and reliability (01.08.2015)
Published in Microelectronics and reliability (01.08.2015)
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Journal Article
Description of supercapacitor performance degradation rate during thermal cycling under constant voltage ageing test
Ayadi, M., Briat, O., Lallemand, R., Eddahech, A., German, R., Coquery, G., Vinassa, J.M
Published in Microelectronics and reliability (01.09.2014)
Published in Microelectronics and reliability (01.09.2014)
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Journal Article
Conference Proceeding
How supercapacitors reach end of life criteria during calendar life and power cycling tests
Chaari, R., Briat, O., Delétage, J.Y., Woirgard, E., Vinassa, J.-M.
Published in Microelectronics and reliability (01.09.2011)
Published in Microelectronics and reliability (01.09.2011)
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Journal Article
Conference Proceeding
Contribution of calendar ageing modes in the performances degradation of supercapacitors during power cycling
Briat, O., Vinassa, J.-M., Bertrand, N., El Brouji, H., Delétage, J.-Y., Woirgard, E.
Published in Microelectronics and reliability (01.09.2010)
Published in Microelectronics and reliability (01.09.2010)
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Journal Article
Conference Proceeding
Comparison between changes of ultracapacitors model parameters during calendar life and power cycling ageing tests
El Brouji, H., Briat, O., Vinassa, J.-M., Bertrand, N., Woirgard, E.
Published in Microelectronics and reliability (01.08.2008)
Published in Microelectronics and reliability (01.08.2008)
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Journal Article
Conference Proceeding
Thermal cycling impacts on supercapacitor performances during calendar ageing
Ayadi, M., Briat, O., Eddahech, A., German, R., Coquery, G., Vinassa, J.M.
Published in Microelectronics and reliability (01.09.2013)
Published in Microelectronics and reliability (01.09.2013)
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Journal Article
Conference Proceeding
Impact of high frequency current ripple on supercapacitors ageing through floating ageing tests
German, R., Briat, O., Sari, A., Venet, P., Ayadi, M., Zitouni, Y., Vinassa, J.M.
Published in Microelectronics and reliability (01.09.2013)
Published in Microelectronics and reliability (01.09.2013)
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Journal Article
Conference Proceeding
Quantification of ageing of ultracapacitors during cycling tests with current profile characteristics of hybrid and electric vehicles applications
LAJNEF, W, VINASSA, J.-M, BRIAT, O, EL BROUJI, H, AZZOPARDI, S, WOIRGARD, E
Published in IET electric power applications (01.09.2007)
Published in IET electric power applications (01.09.2007)
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