A general approach for degradation modeling to enable a widespread use of aging simulations in IC design
Lange, André, Gonzalez, Fabio A. Velarde, Giering, Kay-Uwe, Vervantidis, Anastasios, Hahne, Lukas, Heinig, Andy, Jancke, Roland
Published in Microelectronics and reliability (01.10.2022)
Published in Microelectronics and reliability (01.10.2022)
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