by Thumfart, L, Carrete, J, Vermeersch, B, Ye, N, Truglas, T, Feser, J, Groiss, H, Mingo, N, Rastelli, A
Published in Journal of physics. D, Applied physics (10.01.2018)

by Carrete, J, Vermeersch, B, Thumfart, L, Kakodkar, R. R, Trevisi, G, Frigeri, P, Seravalli, L, Feser, J. P, Rastelli, A, Mingo, N
Published in Journal of physical chemistry. C (22.02.2018)

by Mishra, S., Vermeersch, B., Sankatali, V., Kukner, H., Sharma, A., Mirabeli, G., Bufler, F. M., Brunion, M., Abdi, D., Oprins, H., Biswas, D., Zografos, O., Catthoor, F., Weckx, P., Hellings, G., Myers, J., Ryckaert, J.
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)

by Mishra, S., Sankatali, V., Vermeersch, B., Brunion, M., Lofrano, M., Abdi, D., Oprins, H., Biswas, D., Zografos, O., Hiblot, G., Van Der Plas, G., Weckx, P., Hellings, G., Myers, J., Catthoor, F., Ryckaert, J.
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)

by Vais, A., Yadav, S., Mols, Y., Vermeersch, B., Kodandarama, K. V., Baryshnikova, M., Mannaert, G., Alcotte, R., Boccardi, G., Wambacq, P., Parvais, B., Langer, R., Kunert, B., Collaert, N.
Published in ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC) (19.09.2022)

by Parvais, B., ElKashlan, R., Yu, H., Sibaja-Hernandez, A., Vermeersch, B., Putcha, V., Cardinael, P., Rodriguez, R., Khaled, A., Alian, A., Peralagu, U., Zhao, M., Yadav, S., Gramegna, G., Driessche, J. Van, Collaert, N.
Published in 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (27.09.2021)

by Vermeersch, B., De Mey, G.
Published in Microelectronics and reliability (01.02.2007)

by Vermeersch, B., De Mey, G.
Published in International journal of thermal sciences (01.08.2010)

by Vermeersch, B., De Mey, G.
Published in Microelectronics and reliability (2006)

by Vermeersch, B., De Mey, G.
Published in Microelectronics and reliability (01.05.2008)

by Lohuis, Peter J. F. M., Tan, M. Liane, Bonte, Katrien, van den Brekel, Michiel W. M., Balm, Alfons J. M., Vermeersch, Hubert B.
Published in Annals of otology, rhinology & laryngology (01.04.2009)

by Vermeersch, B., De Mey, G.
Published in Microelectronics and reliability (01.08.2007)

by De Mey, G., Pilarski, J., Wójcik, M., Lasota, M., Banaszczyk, J., Vermeersch, B., Napieralski, A.
Published in International communications in heat and mass transfer (01.03.2009)

by Vermeersch, B, Christofferson, J, Maize, K, Shakouri, A, De Mey, G
Published in 2010 26th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) (01.02.2010)

by Vermeersch, B, De Mey, G
Published in Journal of physics. D, Applied physics (21.04.2007)

by De Mey, G., Vermeersch, B., Banaszczyk, J., Swia¸tczak, T., Wie¸cek, B., Janicki, M., Napieralski, A.
Published in International journal of heat and mass transfer (01.10.2007)

by Vermeersch, B., Mey, G. De
Published in Engineering analysis with boundary elements (01.04.2007)

by Bufler, F. M., Vermeersch, B., Mishra, S., Beckers, A., Ritzenthaler, R., Grill, A., Matagne, P., Hellings, G.
Published in 2024 IEEE Latin American Electron Devices Conference (LAEDC) (08.05.2024)

by Vermeersch, B., Rodriguez, R., Sibaja-Hernandez, A., Vais, A., Yadav, S., Parvais, B., Collaert, N.
Published in 2022 International Electron Devices Meeting (IEDM) (03.12.2022)

by Alavi, S, Yazawa, K, Alers, G, Vermeersch, B, Christofferson, J, Shakouri, A
Published in 2011 27th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (01.03.2011)