Interface analysis of Mg/Sc and Sc/Mg bilayers using X-ray reflectivity
Verma, Hina, Guen, Karine Le, Gupta, Shruti, Dhawan, Rajnish, Modi, Mohammed H., Jonnard, Philippe
Published in Thin solid films (01.12.2022)
Published in Thin solid films (01.12.2022)
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Journal Article
Study of buried interfaces in Fe/Si multilayer by hard x‐ray emission spectroscopy
Verma, Hina, Le Guen, Karine, Delaunay, Renaud, Ismail, Iyas, Ilakovac, Vita, Rueff, Jean Pascal, Zheng, Yunlin Jacques, Jonnard, Philippe
Published in Surface and interface analysis (01.12.2021)
Published in Surface and interface analysis (01.12.2021)
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