Search Results - "Verkuil, Roger L" :: K.UTB vyhledávací portál

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Product wafer junction leakage measurement using corona and a kelvin probe

by VERKUIL; ROGER L
Year of Publication 15.08.2000

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Product wafer junction leakage measurement using light and eddy current

by VERKUIL; ROGER L
Year of Publication 06.06.2000

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Patent

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CONTACTLESS SHEET RESISTANT MEASUREMENT METHOD AND APPARATUS

by VERKUIL, ROGER L
Year of Publication 30.11.1999

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Mobile charge measurement using corona charge and ultraviolet light

by VERKUIL; ROGER L
Year of Publication 10.11.1998

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Method and apparatus for measurement of mobile charges with a corona screen gun

by VERKUIL; ROGER L
Year of Publication 16.06.1998

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Probe-oxide-semiconductor method and apparatus for measuring oxide charge on a semiconductor wafer

by VERKUIL; ROGER L
Year of Publication 19.03.1996

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Contactless electrical thin oxide measurements

by VERKUIL; ROGER L
Year of Publication 16.01.1996

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Contactless Sheet Resistant Measurement Method and Apparatus

by VERKUIL, ROGER L
Year of Publication 31.12.1995

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Contactless sheet resistance measurement method and apparatus

by VERKUIL; ROGER L
Year of Publication 15.08.1995

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Contactless technique for measuring epitaxial dopant concentration profiles in semiconductor wafers

by VERKUIL; ROGER L
Year of Publication 01.06.1993

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Vacuum activated backside contact

by KLEEFSTRA; MEINDERT J, VERKUIL; ROGER L
Year of Publication 18.07.2000

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Non-contact mobile charge measurement with leakage band-bending and dipole correction

by HORNER GREGORY S, HOWLAND WILLIAM H, FUNG MIN-SU, VERKUIL ROGER L
Year of Publication 12.06.2007

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Non-contact mobile charge measurement with leakage band-bending and dipole correction

by Fung, Min-Su, Verkuil, Roger L, Horner, Gregory S, Howland, William H
Year of Publication 12.06.2007

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Contactless total charge measurement with corona

by HORNER GREGORY S, MILLER TOM G, VERKUIL ROGER L
Year of Publication 10.09.2002

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Contactless total charge measurement with corona

by Miller, Tom G, Verkuil, Roger L, Horner, Gregory S
Year of Publication 10.09.2002

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Contactless total charge measurement with corona

by HORNER GREGORY S, MILLER TOM G, VERKUIL ROGER L
Year of Publication 24.01.2002

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Contactless method for measuring total charge of an oxide layer on a semiconductor wafer using corona charge

by Miller, Tom G, Verkuil, Roger L, Horner, Gregory S
Year of Publication 01.01.2002

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Contactless method for measuring total charge of an oxide layer on a semiconductor wafer using corona charge

by HORNER GREGORY S, MILLER TOM G, VERKUIL ROGER L
Year of Publication 01.01.2002

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Non-contact mobile charge measurement with leakage band-bending and dipole correction

by Fung, Min-Su, Verkuil, Roger L, Horner, Gregory S, Howland, William H
Year of Publication 30.08.2005

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Patent

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Non-contact mobile charge measurement with leakage band-bending and dipole correction

by HORNER GREGORY S, HOWLAND WILLIAM H, FUNG MIN-SU, VERKUIL ROGER L
Year of Publication 30.08.2005

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Patent

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