Hybridization of ellipsometry and XPS energy loss: Robust band gap and broadband optical constants determination of SiGe, HfON and MoOx thin films
Levert, Théo, Zakhtser, Alter, Duval, Julien, Raguenez, Chloé, Verdier, Stéphane, Le Cunff, Delphine, Tortai, Jean-Hervé, Pelissier, Bernard
Published in Microelectronic engineering (01.01.2024)
Published in Microelectronic engineering (01.01.2024)
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Chemical compositions of organosilicon thin films deposited on aluminium foil by atmospheric pressure dielectric barrier discharge and their electrochemical behaviour
Boscher, Nicolas D., Choquet, Patrick, Duday, David, Verdier, Stéphane
Published in Surface & coatings technology (25.12.2010)
Published in Surface & coatings technology (25.12.2010)
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Advantages of a Pulsed Electrical Excitation Mode on the Corrosion Performance of Organosilicon Thin Films Deposited on Aluminium Foil by Atmospheric Pressure Dielectric Barrier Discharge
Boscher, Nicolas D., Choquet, Patrick, Duday, David, Verdier, Stéphane
Published in Plasma processes and polymers (22.02.2010)
Published in Plasma processes and polymers (22.02.2010)
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Investigation of Methanol Oxidation over Au/Catalysts Using Operando IR Spectroscopy: Determination of the Active Sites, Intermediate/Spectator Species, and Reaction Mechanism
Rousseau, Séverine, Marie, Olivier, Bazin, Philippe, Daturi, Marco, Verdier, Stéphane, Harlé, Virginie
Published in Journal of the American Chemical Society (11.08.2010)
Published in Journal of the American Chemical Society (11.08.2010)
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Single-Step Process for the Deposition of High Water Contact Angle and High Water Sliding Angle Surfaces by Atmospheric Pressure Dielectric Barrier Discharge
Boscher, Nicolas D., Duday, David, Verdier, Stéphane, Choquet, Patrick
Published in ACS applied materials & interfaces (13.02.2013)
Published in ACS applied materials & interfaces (13.02.2013)
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Interaction of Stearic Acid Deposited on Silicon Samples With Ar/N 2 and Ar/O 2 Atmospheric Pressure Microwave Post‐discharges
Noël, Cédric, Duday, David, Verdier, Stéphane, Choquet, Patrick, Belmonte, Thierry, Migeon, Henri‐Noël
Published in Plasma processes and polymers (01.06.2009)
Published in Plasma processes and polymers (01.06.2009)
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Quantification of substitutional and interstitial carbon in thin SiGeC films using in-line X-ray-photoelectron spectroscopy
Vives, Jeremy, Verdier, Stephane, Deprat, Fabien, Frauenrath, Marvin, Duru, Romain, Juhel, Marc, Berthome, Gregory, Chaussende, Didier
Published in Journal of materials chemistry. C, Materials for optical and electronic devices (06.07.2023)
Published in Journal of materials chemistry. C, Materials for optical and electronic devices (06.07.2023)
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Journal Article
Hybridization of ellipsometry and Xps energy loss: robust band gap and broadband optical constants determination of SiGe, HfON and MoOx thin films
Levert, Théo, Zakhtser, Alter, Duval, Julien, Raguenez, Chloé, Verdier, Stéphane, Le Cunff, Delphine, Tortai, Jean-Hervé, Pelissier, Bernard
Published in Microelectronic engineering (2023)
Published in Microelectronic engineering (2023)
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Journal Article
Interaction of Stearic Acid Deposited on Silicon Samples With Ar/N sub(2) and Ar/O sub(2) Atmospheric Pressure Microwave Post-discharges
Noeel, Cedric, Duday, David, Verdier, Stephane, Choquet, Patrick, Belmonte, Thierry, Migeon, Henri-Noeel
Published in Plasma processes and polymers (01.06.2009)
Published in Plasma processes and polymers (01.06.2009)
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Journal Article
Interaction of Stearic Acid Deposited on Silicon Samples With Ar/N2 and Ar/O2 Atmospheric Pressure Microwave Post-discharges
Noël, Cédric, Duday, David, Verdier, Stéphane, Choquet, Patrick, Belmonte, Thierry, Migeon, Henri-Noël
Published in Plasma processes and polymers (01.06.2009)
Published in Plasma processes and polymers (01.06.2009)
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