Leakage current modeling of test structures for characterization of dark current in CMOS image sensors
Loukianova, N.V., Folkerts, H.O., Maas, J.P.V., Verbugt, D.W.E., Mierop, A.J., Hoekstra, W., Roks, E., Theuwissen, A.J.P.
Published in IEEE transactions on electron devices (01.01.2003)
Published in IEEE transactions on electron devices (01.01.2003)
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Journal Article
CCD imagers for broadcast applications
Stoldt, H., Theuwissen, A.J.P., Vledder, F.F., Centen, P.G.M., Mierop, A., Kleimann, A.C.M., Peek, H.L., Verbugt, D.W.E., Hartog, P.B., de Gruyter, R.H.S.
Published in International Electron Devices Meeting. Technical Digest (1996)
Published in International Electron Devices Meeting. Technical Digest (1996)
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Conference Proceeding