Impact of Sacrificial Hard Mask Material in BEOL Integration in Advanced Technology
Ramanathan, Eswar, Johanson, Henrik, Damjanovic, Daniel, Sun, ZhiGuo, Sircar, Anirvan, Eah, Sang-Kee, Bombardier, Colin, DaSilva, Adam, O'Brien, Brendan, Roux, Alycia, Cucci, Brett, Jiang, Lei, Christopher, Ordonio, Montgomery, Christa, Venkatasubramanian, Vandana, Rana, Vijaya, Mody, Jay, Shepard, Joseph, Child, Craig, Morganfeld, Bradley, Sheraw, Rebekah, Takmeel, Qanit, MaryClaire, Silvestre, Mahalingam, AnbuSelvam K.M., Ghosh, Somnath, Donegan, Keith, Chandrasekar, Ashwini, Singh, Sunil
Published in 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2019)
Published in 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2019)
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Conference Proceeding
Study of Probe Contact Resistance Impact on Inline Testing with Different Bond Pad Design in BEOL
Ramanathan, Eswar, Katragadda, Veenadhar, Gasasira, Arthur, Muthee, Martin, Riendeau, Jeffrey, Hatzistergos, Michael, Mody, Jay, Teo, Kok Hin, Clements, Justin, Qiu, Jian, Wang, Qiushi, Nicolai, Petrov, Liao, Vincent, Hwang, Jung Tae, Krom, Raymond, Venkatasubramanian, Vandana, Bombardier, Colin, Ahmed, Shafaat, Montgomery, Christa, Brown, Owen, Smith, Lloyd, Cusick, Alan, Soler, Edwin, Evans, Bill
Published in 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2019)
Published in 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2019)
Get full text
Conference Proceeding