LFSR-Based Test Generation for Reduced Fail Data Volume
Pomeranz, Irith, Venkataraman, Srikanth
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.12.2020)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.12.2020)
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Journal Article
Automated Debug of Speed Path Failures Using Functional Tests
McLaughlin, R., Venkataraman, S., Lim, C.
Published in 2009 27th IEEE VLSI Test Symposium (01.05.2009)
Published in 2009 27th IEEE VLSI Test Symposium (01.05.2009)
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Conference Proceeding
Defect-Oriented Test: Effectiveness in High Volume Manufacturing
Hapke, Friedrich, Howell, Will, Maxwell, Peter, Brazil, Edward, Venkataraman, Srikanth, Dutta, Rudrajit, Glowatz, Andreas, Fast, Anja, Rajski, Janusz
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.03.2021)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.03.2021)
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Journal Article
Making Manufacturing Work For You
Venkataraman, Srikanth, Puri, Ruchir, Griffith, Steve, Oberai, Ankush, Madge, Robert, Yeric, Greg, Ng, Walter, Zorian, Yervant
Published in 2007 44th ACM/IEEE Design Automation Conference (01.06.2007)
Published in 2007 44th ACM/IEEE Design Automation Conference (01.06.2007)
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Conference Proceeding
Observation Point Placement for Improved Logic Diagnosis based on Large Sets of Candidate Faults
Pomeranz, Irith, Chickermane, Vivek, Venkataraman, Srikanth
Published in 2019 IEEE 37th VLSI Test Symposium (VTS) (01.04.2019)
Published in 2019 IEEE 37th VLSI Test Symposium (VTS) (01.04.2019)
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Conference Proceeding
Using Fault Detection Tests to Produce Diagnostic Tests Targeting Large Sets of Candidate Faults
Addepalli, Hari, Pomeranz, Irith, Amyeen, Enamul, Natarajan, Suriyaprakash, Sinha, Arani, Venkataraman, Srikanth
Published in 2022 IEEE 31st Asian Test Symposium (ATS) (01.11.2022)
Published in 2022 IEEE 31st Asian Test Symposium (ATS) (01.11.2022)
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Conference Proceeding
A Joint Diagnostic Test Generation Procedure with Dynamic Test Compaction
Amyeen, M. Enamul, Pomeranz, Irith, Venkataraman, Srikanth
Published in 2016 IEEE 25th Asian Test Symposium (ATS) (01.11.2016)
Published in 2016 IEEE 25th Asian Test Symposium (ATS) (01.11.2016)
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Conference Proceeding
Improving the Resolution of Multiple Defect Diagnosis by Removing and Selecting Tests
Wang, Naixing, Pomeranz, Irith, Benware, Brady, Amyeen, M. Enamul, Venkataraman, Srikanth
Published in 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (01.10.2018)
Published in 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (01.10.2018)
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Conference Proceeding
Test reordering for improved scan chain diagnosis using an enhanced defect diagnosis procedure
Venkataraman, Srikanth, Pomeranz, Irith, Bodhe, Shraddha, Amyeen, M. Enamul
Published in 2017 IEEE International Test Conference (ITC) (01.10.2017)
Published in 2017 IEEE International Test Conference (ITC) (01.10.2017)
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Conference Proceeding
Extraction Error Modeling and Automated Model Debugging in High-Performance Low Power Custom Designs
Yang, Yu-Shen, Veneris, Andreas, Thadikaran, Paul, Venkataraman, Srikanth
Published in Design, Automation and Test in Europe (07.03.2005)
Published in Design, Automation and Test in Europe (07.03.2005)
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Conference Proceeding
Resynthesis for Avoiding Undetectable Faults Based on Design-for-Manufacturability Guidelines
Wang, Naixing, Pomeranz, Irith, Reddy, Sudhakar M., Sinha, Arani, Venkataraman, Srikanth
Published in 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.03.2019)
Published in 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.03.2019)
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Conference Proceeding
Reduction of diagnostic fail data volume and tester time using a dynamic N-cover algorithm
Bodhe, Shraddha, Amyeen, M. Enamul, Galendez, Clariza, Mooers, Houston, Pomeranz, Irith, Venkataraman, Srikanth
Published in 2016 IEEE 34th VLSI Test Symposium (VTS) (01.04.2016)
Published in 2016 IEEE 34th VLSI Test Symposium (VTS) (01.04.2016)
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Conference Proceeding
Journal Article
Rapid diagnostic fault simulation of stuck-at faults in sequential circuits using compact lists
Venkataraman, Srikanth, Hartanto, Ismed, Fuchs, W. Kent, Rudnick, Elizabeth M., Chakravarty, Sreejit, Patel, Janak H.
Published in 32nd Design Automation Conference (01.01.1995)
Published in 32nd Design Automation Conference (01.01.1995)
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Conference Proceeding
A novel diagnostic test generation methodology and its application in production failure isolation
Amyeen, M. Enamul, Dongok Kim, Chandrasekar, Maheshwar, Noman, Mohammad, Venkataraman, Srikanth, Jain, Anurag, Goel, Neha, Sharma, Ramesh
Published in 2016 IEEE International Test Conference (ITC) (01.11.2016)
Published in 2016 IEEE International Test Conference (ITC) (01.11.2016)
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Conference Proceeding
An algorithmic technique for diagnosis of faulty scan chains
Ruifeng Guo, Venkataraman, S.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.09.2006)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.09.2006)
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Journal Article
A technique for fault diagnosis of defects in scan chains
Ruifeng Guo, Venkataraman, S.
Published in Proceedings International Test Conference 2001 (Cat. No.01CH37260) (2001)
Published in Proceedings International Test Conference 2001 (Cat. No.01CH37260) (2001)
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Conference Proceeding