Creative Use of Vector Scan for Efficient SRAM Inspection
Patterson, Oliver D., Peng, Hsiao-Chi, Hu, Haokun, Huang, Chih-Chung, Venkatachalam, Panneer S.
Published in 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.08.2020)
Published in 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.08.2020)
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