Low-frequency noise in UHV/CVD epitaxial Si and SiGe bipolar transistors
Vempati, L.S., Cressler, J.D., Babcock, J.A., Jaeger, R.C., Harame, D.L.
Published in IEEE journal of solid-state circuits (01.10.1996)
Published in IEEE journal of solid-state circuits (01.10.1996)
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Journal Article
Ionizing radiation tolerance of high-performance SiGe HBT's grown by UHV/CVD
Babcock, J.A., Cressler, J.D., Vempati, L.S., Clark, S.D., Jaeger, R.C., Harame, D.L.
Published in IEEE transactions on nuclear science (01.12.1995)
Published in IEEE transactions on nuclear science (01.12.1995)
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Journal Article
Ionizing radiation tolerance and low-frequency noise degradation in UHV/CVD SiGe HBT's
Babcock, J.A., Cressler, J.D., Vempati, L.S., Clark, S.D., Jaeger, R.C., Harame, D.L.
Published in IEEE electron device letters (01.08.1995)
Published in IEEE electron device letters (01.08.1995)
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Journal Article
Low-frequency noise in UHV/CVD Si- and SiGe-base bipolar transistors
Vempati, L.S., Cressler, J.D., Babcock, J.A., Jaeger, R.C., Harame, D.L.
Published in Proceedings of Bipolar/Bicmos Circuits and Technology Meeting (1995)
Published in Proceedings of Bipolar/Bicmos Circuits and Technology Meeting (1995)
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Conference Proceeding
The effects of reverse-bias emitter-base stress on the cryogenic operation of advanced UHV/CVD Si- and SiGe-base bipolar transistors
Babcock, J.A., Joseph, A.J., Cressler, J.D., Vempati, L.S.
Published in Proceedings of International Reliability Physics Symposium (1996)
Published in Proceedings of International Reliability Physics Symposium (1996)
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Conference Proceeding
Correlation of low-frequency noise and emitter-base reverse-bias stress in epitaxial Si- and SiGe-base bipolar transistors
Babcock, J.A., Cressler, J.D., Vempati, L.S., Joseph, A.J., Harame, D.L.
Published in Proceedings of International Electron Devices Meeting (1995)
Published in Proceedings of International Electron Devices Meeting (1995)
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Conference Proceeding